Inventor · disambiguated record
Marco Tortonese
Also filed as: TORTONESE MARCO
18 granted patents·1 pending application·581 citations·filing 1988–2015
95Inventor score
Files withKLA TENCOR TECH CORP4UNIV LELAND STANFORD JUNIOR4TORTONESE MARCO3ADVANCED BIONICS LLC1KLA TENCOR CORP1
Top patents by PatentIndex Score
19 records- 0194US5345815AAtomic force microscope having cantilever with piezoresistive deflection sensorUNIV LELAND STANFORD JUNIOR·Filed 1992·Granted Sep 13, 1994·124 cites·18 claims
- 0291US7372016B1Calibration standard for a dual beam (FIB/SEM) machineKLA TENCOR TECH CORP·Filed 2005·Granted May 13, 2008·14 cites·27 claims
- 0391US5444244APiezoresistive cantilever with integral tip for scanning probe microscopePARK SCIENT INSTR CORP·Filed 1993·Granted Aug 22, 1995·114 cites·19 claims
- 0490US8245161B1Verification of computer simulation of photolithographic processTORTONESE MARCO·Filed 2008·Granted Aug 14, 2012·17 cites·21 claims
- 0589US5066358ANitride cantilevers with single crystal silicon tipsUNIV LELAND STANFORD JUNIOR·Filed 1988·Granted Nov 19, 1991·65 cites·12 claims
- 0685US5483822ACantilever and method of using same to detect features on a surfaceUNIV LELAND STANFORD JUNIOR·Filed 1994·Granted Jan 16, 1996·51 cites·7 claims
- 0782US9211403B2Steerable styletTORTONESE MARCO·Filed 2010·Granted Dec 15, 2015·18 cites·5 claims
- 0882US6646737B2Submicron dimensional calibration standards and methods of manufacture and useKLA TENCOR TECHNOLOGIES·Filed 2001·Granted Nov 11, 2003·19 cites·49 claims
- 0980US7576317B1Calibration standard for a dual beam (FIB/SEM) machineKLA TENCOR TECH CORP·Filed 2008·Granted Aug 18, 2009·4 cites·22 claims
- 1077US5595942AMethod of fabricating cantilever for atomic force microscope having piezoresistive deflection detectorUNIV LELAND STANFORD JUNIOR·Filed 1995·Granted Jan 21, 1997·44 cites·7 claims
- 1173US5952657AAtomic force microscope with integrated optics for attachment to optical microscopeTHERMO MICROSCOPES CORP·Filed 1997·Granted Sep 14, 1999·54 cites·40 claims
- 1266US8943443B1Verification of computer simulation of photolithographic processTORTONESE MARCO·Filed 2012·Granted Jan 27, 2015·1 cites·11 claims
- 1361US5861624AAtomic force microscope for attachment to optical microscopePARK SCIENT INSTR·Filed 1997·Granted Jan 19, 1999·31 cites·61 claims
- 1459US7453571B1Dimensional calibration standardsKLA TENCOR CORP·Filed 2007·Granted Nov 18, 2008·3 cites·28 claims
- 1556US7301638B1Dimensional calibration standardsKLA TENCOR INC·Filed 2004·Granted Nov 27, 2007·8 cites·41 claims
- 1648US6005251AVoice coil scanner for use in scanning probe microscopeTHERMOMICROSCOPES CORP·Filed 1998·Granted Dec 21, 1999·12 cites·30 claims
- 1747US2016096013A1Steerable StyletADVANCED BIONICS LLC·Filed 2015·Application pending·0 cites
- 1843US7423264B2Atomic force microscopeKLA TENCOR TECH CORP·Filed 2006·Granted Sep 9, 2008·0 cites·30 claims
- 1941US6821812B1Structure and method for mounting a small sample in an opening in a larger substrateKLA TENCOR TECH CORP·Filed 2002·Granted Nov 23, 2004·2 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Marco Tortonese files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →