Inventor · disambiguated record
Yoshio Bamba
Also filed as: BAMBA YOSHIO
4 granted patents·6 citations·filing 2007–2012
65Inventor score
Top patents by PatentIndex Score
4 records- 0173US7589833B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 15, 2009·4 cites·18 claims
- 0257US7876431B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 25, 2011·0 cites·7 claims
- 0356US9097686B2Optical type inspection apparatus, inspection system and the wafer for coordinates managementBAMBA YOSHIO·Filed 2012·Granted Aug 4, 2015·2 cites·13 claims
- 0448US8625089B2Foreign matter inspection apparatus and foreign matter inspection methodBAMBA YOSHIO·Filed 2010·Granted Jan 7, 2014·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →