Assignee
BAMBA YOSHIO
JP·2 granted patents·2 citations·filing 2010–2012
Top patents by PatentIndex Score
2 records- 0156US9097686B2Optical type inspection apparatus, inspection system and the wafer for coordinates managementBAMBA YOSHIO·Filed 2012·Granted Aug 4, 2015·2 cites·13 claims
- 0248US8625089B2Foreign matter inspection apparatus and foreign matter inspection methodBAMBA YOSHIO·Filed 2010·Granted Jan 7, 2014·0 cites·16 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →