Inventor · disambiguated record
Guy Eytan
Also filed as: EYTAN GUY
15 granted patents·4 pending applications·15 citations·filing 2004–2024
86Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD15APPLIED MATERIALS INC1EYTAN GUY1ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1XJET LTD1
Top patents by PatentIndex Score
19 records- 0188US10217621B2Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Feb 26, 2019·8 cites·22 claims
- 0287US11049704B1Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 29, 2021·3 cites·15 claims
- 0379US11264202B2Generating three dimensional information regarding structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0467US11189451B2Charged particle beam source and a method for assembling a charged particle beam sourceAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Nov 30, 2021·0 cites·20 claims
- 0567US2025091290A1Methods and systems for printing 3d object by inkjetXJET LTD·Filed 2024·Application pending·0 cites
- 0664US10886092B2Charged particle beam source and a method for assembling a charged particle beam sourceAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 5, 2021·0 cites·20 claims
- 0763US8804299B2Electrostatic chuck and a method for supporting a waferEYTAN GUY·Filed 2012·Granted Aug 12, 2014·3 cites·21 claims
- 0862US2025341481A1Non-destructive surface metrology of patterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0960US2025095955A1Method and system for calibration of diffraction anglesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1058US12456600B2Scanning electron microscopy-based tomography of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 1157US2025391707A1Method and system for 3d reconstruction of wafer structure by diagonal millingAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1248US11355309B2Sensor for electron detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jun 7, 2022·0 cites·15 claims
- 1348US10910204B2Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims
- 1447US10716197B2System, computer program product, and method for dissipation of an electrical chargeAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jul 14, 2020·0 cites·20 claims
- 1547US10249472B2Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2017·Granted Apr 2, 2019·0 cites·18 claims
- 1644US11921063B2Lateral recess measurement in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1744US11694869B2Evaluating a contact between a wafer and an electrostatic chuckAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jul 4, 2023·0 cites·22 claims
- 1839US11810765B2Reactive particles supply systemAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Nov 7, 2023·0 cites·20 claims
- 1937US7235794B2System and method for inspecting charged particle responsive resistAPPLIED MATERIALS INC·Filed 2004·Granted Jun 26, 2007·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →