Inventor · disambiguated record
Toshifumi Suganaga
Also filed as: SUGANAGA TOSHIFUMI
9 granted patents·1 pending application·48 citations·filing 1995–2017
84Inventor score
Top patents by PatentIndex Score
10 records- 0169US7727709B2Method of forming resist pattern and method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Jun 1, 2010·2 cites·8 claims
- 0263US6352800B1Reticle for use in exposing semiconductor, method of producing the reticle, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Mar 5, 2002·8 cites·13 claims
- 0351US6295629B1Focus correcting method and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Sep 25, 2001·14 cites·10 claims
- 0447US5539231ADynamic random access memory device having reduced stepped portionsMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 23, 1996·13 cites·4 claims
- 0547US2010203456A1Method of forming resist pattern and method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2010·Application pending·0 cites
- 0644US10418327B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Sep 17, 2019·0 cites·16 claims
- 0744US5776825AMethod for forming a semiconductor device having reduced stepped portionsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jul 7, 1998·11 cites·11 claims
- 0837US9711344B2Semiconductor device manufacturing method using a multilayer resistRENESAS ELECTRONICS CORP·Filed 2016·Granted Jul 18, 2017·0 cites·12 claims
- 0935US6717652B2Exposure apparatus, exposure method and semiconductor device fabricated with the exposure methodRENESAS TECH CORP·Filed 2001·Granted Apr 6, 2004·0 cites·5 claims
- 1029US6087693ASemiconductor device with reduced stepped portionsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jul 11, 2000·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →