Inventor · disambiguated record
William F. Mcmahon
Also filed as: MCMAHON WILLIAM · MCMAHON WILLIAM F
28 granted patents·2 pending applications·122 citations·filing 2011–2021
95Inventor score
Top patents by PatentIndex Score
30 records- 0197US9630739B2Plastic corrugated container and intermediary blankORBIS CORP·Filed 2014·Granted Apr 25, 2017·18 cites·19 claims
- 0296US9604750B2Plastic corrugated container with ultrasonically formed score linesORBIS CORP·Filed 2014·Granted Mar 28, 2017·14 cites·20 claims
- 0395US8864017B2Plastic corrugated container with improved fold lines and method and apparatus for making sameMCMAHON WILLIAM F·Filed 2011·Granted Oct 21, 2014·21 cites·19 claims
- 0490US11072140B2Balanced process for extrusion of plastic corrugated sheet and subsequent converting into plastic boxesORBIS CORP·Filed 2018·Granted Jul 27, 2021·3 cites·15 claims
- 0586US10829265B2Straight consistent body scores on plastic corrugated boxes and a process for making sameORBIS CORP·Filed 2017·Granted Nov 10, 2020·5 cites·19 claims
- 0686US9555918B2Plastic corrugated container with manufacturer's joint adding zero extra thicknessORBIS CORP·Filed 2014·Granted Jan 31, 2017·11 cites·18 claims
- 0784US10829264B2Process for forming plastic corrugated container with ultrasonically formed score linesORBIS CORP·Filed 2014·Granted Nov 10, 2020·4 cites·22 claims
- 0882US11702241B2Plastic corrugated container with sealed edgesORBIS CORP·Filed 2019·Granted Jul 18, 2023·2 cites·19 claims
- 0982US9702926B2Methods, apparatus and system for screening process splits for technology developmentGLOBALFOUNDRIES INC·Filed 2014·Granted Jul 11, 2017·4 cites·20 claims
- 1081US9372226B2Wafer test structures and methods of providing wafer test structuresGLOBALFOUNDRIES INC·Filed 2014·Granted Jun 21, 2016·5 cites·18 claims
- 1180US10252832B2Plastic corrugated container with sealed edgesORBIS CORP·Filed 2014·Granted Apr 9, 2019·4 cites·16 claims
- 1278US11072455B2Process for forming plastic corrugated container and intermediary blankORBIS CORP·Filed 2014·Granted Jul 27, 2021·2 cites·21 claims
- 1378US8907687B2Integrated circuit with stress generator for stressing test devicesMCMAHON WILLIAM·Filed 2012·Granted Dec 9, 2014·7 cites·23 claims
- 1477US11643241B2Process for forming plastic corrugated container and intermediary blankORBIS CORP·Filed 2021·Granted May 9, 2023·0 cites·7 claims
- 1574USD666898SWire harnessMCMAHON WILLIAM F·Filed 2011·Granted Sep 11, 2012·20 cites·1 claims
- 1672US11760530B2Process for forming plastic corrugated container with ultrasonically formed score linesORBIS CORP·Filed 2020·Granted Sep 19, 2023·0 cites·10 claims
- 1764US9599656B2Methods, apparatus and system for voltage ramp testingGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 21, 2017·1 cites·20 claims
- 1859US10054630B2Methods, apparatus and system for screening process splits for technology developmentGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 21, 2018·0 cites·20 claims
- 1958US11325740B2Straight consistent body scores on plastic corrugated boxes and a process for making sameORBIS CORP·Filed 2020·Granted May 10, 2022·0 cites·19 claims
- 2054US11643242B2Air vent for welded portion in plastic corrugated material, and process for forming welded portionORBIS CORP·Filed 2017·Granted May 9, 2023·0 cites·15 claims
- 2152US8817570B2Devices having bias temperature instability compensationMCMAHON WILLIAM·Filed 2012·Granted Aug 26, 2014·1 cites·18 claims
- 2250US9500703B2Semiconductor structure having test deviceGLOBALFOUNDRIES INC·Filed 2014·Granted Nov 22, 2016·0 cites·14 claims
- 2340US2015377956A1Method and apparatus for inline device characterization and temperature profilingGLOBALFOUNDRIES INC·Filed 2014·Application pending·0 cites
- 2439US10068660B2Methods, apparatus, and system for global healing of write-limited die through bias temperature instabilityGLOBALFOUNDRIES INC·Filed 2017·Granted Sep 4, 2018·0 cites·9 claims
- 2539US9916212B2Method, apparatus, and system for targeted healing of write fails through bias temperature instabilityGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 13, 2018·0 cites·19 claims
- 2639US9704600B1Method, apparatus, and system for global healing of write-limited die through bias temperature instabilityGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 11, 2017·0 cites·20 claims
- 2738US2013033285A1Methods for reliability testing of semiconductor devicesGLOBALFOUNDRIES INC·Filed 2011·Application pending·0 cites
- 2835US9601188B1Method, apparatus and system for targeted healing of stability failures through bias temperature instabilityGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 21, 2017·0 cites·19 claims
- 2935US9548136B2Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage responseGLOBALFOUNDRIES INC·Filed 2015·Granted Jan 17, 2017·0 cites·13 claims
- 3034US9601187B1Method, apparatus, and system for global healing of stability-limited die through bias temperature instabilityGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 21, 2017·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →