Inventor · disambiguated record
Erik Franken
Also filed as: FRANKEN ERIK · FRANKEN ERIK MICHIEL
16 granted patents·6 pending applications·22 citations·filing 2013–2025
89Inventor score
Files withFEI CO22
Top patents by PatentIndex Score
22 records- 0193US11756762B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2022·Granted Sep 12, 2023·2 cites·15 claims
- 0291US11257656B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2020·Granted Feb 22, 2022·3 cites·21 claims
- 0385US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0485US8912491B2Method of performing tomographic imaging of a sample in a charged-particle microscopeFEI CO·Filed 2013·Granted Dec 16, 2014·7 cites·18 claims
- 0581US12074007B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2023·Granted Aug 27, 2024·0 cites·15 claims
- 0675US10122946B2Method for detecting particulate radiationFEI CO·Filed 2016·Granted Nov 6, 2018·2 cites·13 claims
- 0772US10665419B2Intelligent pre-scan in scanning transmission charged particle microscopyFEI CO·Filed 2019·Granted May 26, 2020·1 cites·12 claims
- 0869US11151356B2Using convolution neural networks for on-the-fly single particle reconstructionFEI CO·Filed 2019·Granted Oct 19, 2021·2 cites·15 claims
- 0969US10825647B2Innovative imaging technique in transmission charged particle microscopyFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·11 claims
- 1067US11799486B2Systems and methods for quantum computing based sample analysisFEI CO·Filed 2022·Granted Oct 24, 2023·0 cites·19 claims
- 1165US11887809B2Auto-tuning stage settling time with feedback in charged particle microscopyFEI CO·Filed 2022·Granted Jan 30, 2024·0 cites·20 claims
- 1262US11990315B2Measurement and correction of optical aberrations in charged particle beam microscopyFEI CO·Filed 2022·Granted May 21, 2024·0 cites·20 claims
- 1362US2025125116A1Correction of optical aberrations in charged particle beam microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1461US12327342B2Automatic particle beam focusingFEI CO·Filed 2022·Granted Jun 10, 2025·0 cites·19 claims
- 1561US2025323012A1Method for obtaining a tilt series of images of a sample at a plurality of tilt anglesFEI CO·Filed 2025·Application pending·0 cites
- 1661US2025323011A1Charged particle microscope having a charged particle detectorFEI CO·Filed 2025·Application pending·0 cites
- 1760US11742175B2Defective pixel management in charged particle microscopyFEI CO·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 1860US2024402103A1Methods for three-dimensional tomography of elongated samplesFEI CO·Filed 2024·Application pending·0 cites
- 1960US2025321197A1Method for obtaining a tilt series of images of a sample at a plurality of tilt anglesFEI CO·Filed 2025·Application pending·0 cites
- 2056US2025349501A1Drift compensation for radiation-sensitive specimensFEI CO·Filed 2024·Application pending·0 cites
- 2154US10389955B2Method for detecting particulate radiationFEI CO·Filed 2018·Granted Aug 20, 2019·0 cites·21 claims
- 2251US11501197B2Systems and methods for quantum computing based sample analysisFEI CO·Filed 2019·Granted Nov 15, 2022·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →