Inventor · disambiguated record
Gordon Abbott
Also filed as: ABBOTT GORDON
3 granted patents·1 pending application·99 citations·filing 2007–2011
75Inventor score
Top patents by PatentIndex Score
4 records- 0196US7904845B2Determining locations on a wafer to be reviewed during defect reviewKLA TENCOR CORP·Filed 2007·Granted Mar 8, 2011·50 cites·24 claims
- 0293US8194968B2Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functionsPARK ALLEN·Filed 2008·Granted Jun 5, 2012·33 cites·85 claims
- 0379US8175373B2Use of design information and defect image information in defect classificationABBOTT GORDON·Filed 2009·Granted May 8, 2012·16 cites·21 claims
- 0438US2012223227A1Apparatus and methods for real-time three-dimensional sem imaging and viewing of semiconductor wafersCHEN CHIEN-HUEI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →