Inventor · disambiguated record
Agajan Suvkhanov
Also filed as: SUVKHANOV AGAJAN
6 granted patents·3 pending applications·58 citations·filing 2002–2007
80Inventor score
Top patents by PatentIndex Score
9 records- 0177US6998343B1Method for creating barrier layers for copper diffusionLSI LOGIC CORP·Filed 2003·Granted Feb 14, 2006·26 cites·17 claims
- 0271US7414721B1In-situ metrology system and method for monitoring metalization and other thin film formationLSI CORP·Filed 2002·Granted Aug 19, 2008·17 cites·8 claims
- 0364US6982229B2Ion recoil implantation and enhanced carrier mobility in CMOS deviceLSI LOGIC CORP·Filed 2003·Granted Jan 3, 2006·9 cites·5 claims
- 0455US7148131B1Method for implanting ions in a semiconductorLSI LOGIC CORP·Filed 2002·Granted Dec 12, 2006·6 cites·16 claims
- 0549US2008085589A1Fabrication of strained silicon film via implantation at elevated substrate temperaturesLSI LOGIC CORP·Filed 2007·Application pending·0 cites
- 0647US7129516B2Ion recoil implantation and enhanced carrier mobility in CMOS deviceLSI LOGIC CORP·Filed 2005·Granted Oct 31, 2006·0 cites·4 claims
- 0744US2006163581A1Fabrication of strained silicon film via implantation at elevated substrate temperaturesLSI LOGIC CORP·Filed 2005·Application pending·0 cites
- 0837US7429749B2Strained-silicon for CMOS device using amorphous silicon deposition or silicon epitaxial growthLSI CORP·Filed 2003·Granted Sep 30, 2008·0 cites·21 claims
- 0935US2004206951A1Ion implantation in channel region of CMOS device for enhanced carrier mobilityFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →