Inventor · disambiguated record
Teng-Chin Kuo
Also filed as: KUO TENG-CHIN
5 granted patents·3 pending applications·8 citations·filing 2014–2016
69Inventor score
Files withUNITED MICROELECTRONICS CORP8
Top patents by PatentIndex Score
8 records- 0183US9482964B2Overlap mark set and method for selecting recipe of measuring overlap errorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 1, 2016·4 cites·10 claims
- 0275US9400435B2Method of correcting overlay errorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jul 26, 2016·2 cites·21 claims
- 0371US9305884B1Overlay mark and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Apr 5, 2016·2 cites·5 claims
- 0450US9494873B2Asymmetry compensation method used in lithography overlay processUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 15, 2016·0 cites·13 claims
- 0548US9448471B2Photo-mask and method of manufacturing semiconductor structures by using the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 20, 2016·0 cites·20 claims
- 0646US2016172308A1Overlay markUNITED MICROELECTRONICS CORP·Filed 2016·Application pending·0 cites
- 0745US2016103396A1Double patterning methodUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 0844US2016126194A1Measurement mark structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →