Inventor · disambiguated record
Brian C. Leslie
Also filed as: LESLIE BRIAN · LESLIE BRIAN C
14 granted patents·3 pending applications·1,078 citations·filing 1990–2007
95Inventor score
Files withKLA TENCOR CORP5KLA TENCOR TECH CORP5TENCOR INSTRUMENTS3KLA TENCOR1KLA TENCOR TECHNOLOGIES INC1
Top patents by PatentIndex Score
17 records- 0198US7656170B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2007·Granted Feb 2, 2010·96 cites·12 claims
- 0298US6081325AOptical scanning system for surface inspectionKLA TENCOR CORP·Filed 1997·Granted Jun 27, 2000·279 cites·67 claims
- 0396US6433561B1Methods and apparatus for optimizing semiconductor inspection toolsKLA TENCOR CORP·Filed 2000·Granted Aug 13, 2002·159 cites·18 claims
- 0495US6445199B1Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structuresKLA TENCOR CORP·Filed 2000·Granted Sep 3, 2002·106 cites·20 claims
- 0595US5355212AProcess for inspecting patterned wafersTENCOR INSTRUMENTS·Filed 1993·Granted Oct 11, 1994·163 cites·29 claims
- 0694US7012439B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2005·Granted Mar 14, 2006·21 cites·9 claims
- 0793US6888627B2Optical scanning system for surface inspectionKLA TENCOR CORP·Filed 2003·Granted May 3, 2005·40 cites·163 claims
- 0892US6566885B1Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted May 20, 2003·57 cites·24 claims
- 0990US7477372B2Optical scanning system for surface inspectionKLA TENCOR TECH CORP·Filed 2007·Granted Jan 13, 2009·10 cites·40 claims
- 1086US7711177B2Methods and systems for detecting defects on a specimen using a combination of bright field channel data and dark field channel dataKLA TENCOR TECH CORP·Filed 2006·Granted May 4, 2010·11 cites·22 claims
- 1185US6867606B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECHNOLOGIES INC·Filed 2003·Granted Mar 15, 2005·28 cites·6 claims
- 1283US5276498AAdaptive spatial filter for surface inspectionTENCOR INSTRUMENTS·Filed 1992·Granted Jan 4, 1994·70 cites·13 claims
- 1381US7075637B2Optical scanning system for surface inspectionKLA TENCOR CORP·Filed 2003·Granted Jul 11, 2006·13 cites·51 claims
- 1462US5083035APosition location in surface scanning using interval timing between scan marks on test wafersTENCOR INSTRUMENTS·Filed 1990·Granted Jan 21, 1992·25 cites·10 claims
- 1556US2006203235A1Optical Scanning System for Surface InspectionKLA TENCOR TECH CORP·Filed 2006·Application pending·0 cites
- 1654US2005110986A1Scanning system for inspecting anamolies on surfacesFiled 2004·Application pending·0 cites
- 1748US2002097393A1Scanning system for inspecting anamolies on surfacesFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →