Inventor · disambiguated record
Stephen Hiebert
Also filed as: HIEBERT STEPHEN
4 granted patents·177 citations·filing 2002–2022
78Inventor score
Top patents by PatentIndex Score
4 records- 0191US7126699B1Systems and methods for multi-dimensional metrology and/or inspection of a specimenKLA TENCOR TECH CORP·Filed 2003·Granted Oct 24, 2006·91 cites·42 claims
- 0291US6917421B1Systems and methods for multi-dimensional inspection and/or metrology of a specimenKLA TENCOR TECH CORP·Filed 2002·Granted Jul 12, 2005·67 cites·20 claims
- 0390US10599951B2Training a neural network for defect detection in low resolution imagesKLA TENCOR CORP·Filed 2019·Granted Mar 24, 2020·19 cites·31 claims
- 0453US12372345B23D profilometry with a Linnik interferometerKLA CORP·Filed 2022·Granted Jul 29, 2025·0 cites·55 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →