Inventor · disambiguated record
Deepak I. Hanagandi
Also filed as: HANAGANDI DEEPAK I · HANAGANDI DEEPAK IRAPPA
13 granted patents·9 citations·filing 2013–2024
84Inventor score
Top patents by PatentIndex Score
13 records- 0167US8918690B2Decreasing power supply demand during BIST initializationsIBM·Filed 2013·Granted Dec 23, 2014·3 cites·20 claims
- 0266US10014074B2Failure analysis and repair register sharing for memory BISTGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 3, 2018·2 cites·20 claims
- 0360US12511704B2Method for performing tile to raster (T2R) conversion in deep learning hardware acceleratorSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Dec 30, 2025·0 cites·20 claims
- 0456US10950325B2Memory built-in self test error correcting code (MBIST ECC) for low voltage memoriesMARVELL ASIA PTE LTD·Filed 2019·Granted Mar 16, 2021·1 cites·16 claims
- 0554US10490296B2Memory built-in self-test (MBIST) test time reductionGLOBALFOUNDRIES INC·Filed 2016·Granted Nov 26, 2019·1 cites·20 claims
- 0654US9761329B2Built-in self-test (BIST) circuit and associated BIST method for embedded memoriesGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 12, 2017·1 cites·20 claims
- 0754US9715942B2Built-in self-test (BIST) circuit and associated BIST method for embedded memoriesIBM·Filed 2015·Granted Jul 25, 2017·1 cites·20 claims
- 0853US11669733B2Processing unit and method for computing a convolution using a hardware-implemented spiral algorithmMARVELL ASIA PTE LTD·Filed 2019·Granted Jun 6, 2023·0 cites·17 claims
- 0949US9859019B1Programmable counter to control memory built in self-testIBM·Filed 2017·Granted Jan 2, 2018·0 cites·20 claims
- 1048US10622090B2Arbitration for memory diagnosticsIBM·Filed 2018·Granted Apr 14, 2020·0 cites·20 claims
- 1141US11580059B2Multi-port memory architecture for a systolic arrayMARVELL INT LTD·Filed 2019·Granted Feb 14, 2023·0 cites·19 claims
- 1241US10153055B2Arbitration for memory diagnosticsIBM·Filed 2015·Granted Dec 11, 2018·0 cites·20 claims
- 1338US9773570B2Built-in-self-test (BIST) test time reductionIBM·Filed 2013·Granted Sep 26, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →