Inventor · disambiguated record
Cheryl Hartfield
Also filed as: HARTFIELD CHERYL · HARTFIELD CHERYL D · HARTFIELD CHERYL DIANE
11 granted patents·4 pending applications·232 citations·filing 2001–2021
88Inventor score
Files withOMNIPROBE INC4TEXAS INSTRUMENTS INC4OXFORD INSTR NANOTECHNOLOGY TOOLS LTD2HARTFIELD CHERYL1HARTFIELD CHERYL D1
Top patents by PatentIndex Score
15 records- 0195US6420722B2Method for sample separation and lift-out with one cutOMNIPROBE INC·Filed 2001·Granted Jul 16, 2002·179 cites·16 claims
- 0289US8440969B2Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam imagesMOORE THOMAS M·Filed 2011·Granted May 14, 2013·14 cites·30 claims
- 0380US6435398B2Method for chemically reworking metal layers on integrated circuit bond padsTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 20, 2002·23 cites·14 claims
- 0477US9097625B2Gas injection system for energetic-beam instrumentsOMNIPROBE INC·Filed 2013·Granted Aug 4, 2015·1 cites·20 claims
- 0576US9349573B2Total release method for sample extraction in an energetic-beam instrumentOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2015·Granted May 24, 2016·2 cites·21 claims
- 0676US8513622B2Method for extracting frozen specimens and manufacture of specimen assembliesHARTFIELD CHERYL·Filed 2012·Granted Aug 20, 2013·5 cites·36 claims
- 0768US7495749B2Rapid method for sub-critical fatigue crack growth evaluationTEXAS INSTRUMENTS INC·Filed 2005·Granted Feb 24, 2009·1 cites·20 claims
- 0868US7225681B2Statistical method for identifying microcracks in insulatorsTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 5, 2007·5 cites·7 claims
- 0958US6752012B2Combined electrical test and mechanical test system for thin film characterizationTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 22, 2004·2 cites·9 claims
- 1050US9704689B2Method of reducing the thickness of a target sampleOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2014·Granted Jul 11, 2017·0 cites·40 claims
- 1145US2022349789A1Method to prepare a sample for atom probe tomography (apt), preparation device to perform such method and method to investigate a region of interest of a sample including such performing methodZEISS CARL SMT GMBH·Filed 2021·Application pending·0 cites
- 1240US8759765B2Method for processing samples held by a nanomanipulatorHARTFIELD CHERYL D·Filed 2012·Granted Jun 24, 2014·0 cites·13 claims
- 1339US2015318141A1Gas injection system for energetic-beam instrumentsOMNIPROBE INC·Filed 2015·Application pending·0 cites
- 1436US2004115934A1Method of improving contact resistanceFiled 2002·Application pending·0 cites
- 1527US2016189929A1Rapid tem sample preparation method with backside fib millingOMNIPROBE INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →