Assignee
OMNIPROBE INC
US·20 granted patents·7 pending applications·519 citations·filing 2001–2015
Top patents by PatentIndex Score
27 records- 0197US7115882B2TEM sample holderOMNIPROBE INC·Filed 2006·Granted Oct 3, 2006·26 cites·31 claims
- 0296US6570170B2Total release method for sample extraction from a charged-particle instrumentOMNIPROBE INC·Filed 2002·Granted May 27, 2003·93 cites·17 claims
- 0395US7414252B2Method and apparatus for the automated process of in-situ lift-outOMNIPROBE INC·Filed 2005·Granted Aug 19, 2008·34 cites·65 claims
- 0495US6420722B2Method for sample separation and lift-out with one cutOMNIPROBE INC·Filed 2001·Granted Jul 16, 2002·179 cites·16 claims
- 0594US7126133B2Kit for preparing a tem sample holderOMNIPROBE INC·Filed 2006·Granted Oct 24, 2006·23 cites·15 claims
- 0693US7315023B2Method of preparing a sample for examination in a TEMOMNIPROBE INC·Filed 2006·Granted Jan 1, 2008·13 cites·31 claims
- 0792US7395727B2Strain detection for automated nano-manipulationOMNIPROBE INC·Filed 2005·Granted Jul 8, 2008·17 cites·9 claims
- 0891US7381971B2Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscopeOMNIPROBE INC·Filed 2005·Granted Jun 3, 2008·36 cites·40 claims
- 0991US7126132B2Apparatus for preparing a TEM sample holderOMNIPROBE INC·Filed 2006·Granted Oct 24, 2006·16 cites·6 claims
- 1087US7834315B2Method for STEM sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2008·Granted Nov 16, 2010·8 cites·12 claims
- 1185US6777674B2Method for manipulating microscopic particles and analyzingOMNIPROBE INC·Filed 2002·Granted Aug 17, 2004·25 cites·65 claims
- 1284US7644637B2Method and apparatus for transfer of samples in a controlled environmentOMNIPROBE INC·Filed 2007·Granted Jan 12, 2010·20 cites·25 claims
- 1383US7208724B2Apparatus and method of detecting probe tip contact with a surfaceOMNIPROBE INC·Filed 2005·Granted Apr 24, 2007·8 cites·18 claims
- 1480US7053383B2Method and apparatus for rapid sample preparation in a focused ion beam microscopeOMNIPROBE INC·Filed 2004·Granted May 30, 2006·13 cites·8 claims
- 1578US7961397B2Single-channel optical processing system for energetic-beam microscopesOMNIPROBE INC·Filed 2008·Granted Jun 14, 2011·5 cites·40 claims
- 1677US9097625B2Gas injection system for energetic-beam instrumentsOMNIPROBE INC·Filed 2013·Granted Aug 4, 2015·1 cites·20 claims
- 1767US7446542B2Apparatus and method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2006·Granted Nov 4, 2008·2 cites·7 claims
- 1864USRE46350EMethod for stem sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2014·Granted Mar 28, 2017·0 cites·10 claims
- 1956US7755372B2Method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2008·Granted Jul 13, 2010·0 cites·10 claims
- 2056US2010068408A1Methods for electron-beam induced deposition of material inside energetic-beam microscopesOMNIPROBE INC·Filed 2008·Application pending·0 cites
- 2155US2011204226A1Apparatus for stem sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2011·Application pending·0 cites
- 2254US2011017922A1Variable-tilt tem specimen holder for charged-particle beam instrumentsOMNIPROBE INC·Filed 2009·Application pending·0 cites
- 2353US2010025580A1Grid holder for stem analysis in a charged particle instrumentOMNIPROBE INC·Filed 2009·Application pending·0 cites
- 2447US8054558B2Multiple magnification optical system with single objective lensOMNIPROBE INC·Filed 2010·Granted Nov 8, 2011·0 cites·12 claims
- 2545US2010200546A1Method of etching materials with electron beam and laser energyOMNIPROBE INC·Filed 2010·Application pending·0 cites
- 2639US2015318141A1Gas injection system for energetic-beam instrumentsOMNIPROBE INC·Filed 2015·Application pending·0 cites
- 2727US2016189929A1Rapid tem sample preparation method with backside fib millingOMNIPROBE INC·Filed 2015·Application pending·0 cites
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