Inventor · disambiguated record
Paul Frank Marella
Also filed as: MARELLA PAUL · MARELLA PAUL F · MARELLA PAUL FRANK
8 granted patents·2 pending applications·364 citations·filing 1996–2019
88Inventor score
Top patents by PatentIndex Score
10 records- 0198US7514681B1Electrical process monitoring using mirror-mode electron microscopyKLA TENCOR TECH CORP·Filed 2006·Granted Apr 7, 2009·94 cites·32 claims
- 0291US5804004AStacked devices for multichip modulesNCHIP INC·Filed 1996·Granted Sep 8, 1998·191 cites·18 claims
- 0389US7236847B2Systems and methods for closed loop defect reductionKLA TENCOR TECH CORP·Filed 2003·Granted Jun 26, 2007·56 cites·56 claims
- 0479US9002497B2Methods and systems for inspection of wafers and reticles using designer intent dataVOLK WILLIAM·Filed 2004·Granted Apr 7, 2015·14 cites·39 claims
- 0575US10713771B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2018·Granted Jul 14, 2020·1 cites·29 claims
- 0669US8384887B2Methods and systems for inspection of a specimen using different inspection parametersKLA TENCOR TECH CORP·Filed 2010·Granted Feb 26, 2013·1 cites·41 claims
- 0768US7738089B2Methods and systems for inspection of a specimen using different inspection parametersKLA TENCOR TECH CORP·Filed 2004·Granted Jun 15, 2010·7 cites·16 claims
- 0865US11348222B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2019·Granted May 31, 2022·0 cites·30 claims
- 0957US2008081385A1Methods and systems for inspection of wafers and reticles using designer intent dataMARELLA PAUL F·Filed 2007·Application pending·0 cites
- 1056US2015178914A1Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent DataKLA TENCOR TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →