Inventor · disambiguated record
Yury Yuditsky
Also filed as: YUDITSKY YURY
8 granted patents·66 citations·filing 2012–2021
82Inventor score
Top patents by PatentIndex Score
8 records- 0195US9426400B2Method and apparatus for high speed acquisition of moving images using pulsed illuminationKLA TENCOR CORP·Filed 2013·Granted Aug 23, 2016·32 cites·20 claims
- 0294US9279774B2Wafer inspectionROMANOVSKY ANATOLY·Filed 2012·Granted Mar 8, 2016·29 cites·19 claims
- 0390US10488348B2Wafer inspectionKLA TENCOR CORP·Filed 2018·Granted Nov 26, 2019·3 cites·57 claims
- 0466US9091666B2Extended defect sizing range for wafer inspectionCAI ZHONGPING·Filed 2012·Granted Jul 28, 2015·2 cites·21 claims
- 0560US9915622B2Wafer inspectionKLA TENCOR CORP·Filed 2015·Granted Mar 13, 2018·0 cites·20 claims
- 0651US12345658B2Large-particle monitoring with laser power control for defect inspectionKLA CORP·Filed 2021·Granted Jul 1, 2025·0 cites·32 claims
- 0746US9587936B2Scanning inspection system with angular correctionKLA TENCOR CORP·Filed 2013·Granted Mar 7, 2017·0 cites·21 claims
- 0835US10495579B2System and method for compensation of illumination beam misalignmentKLA TENCOR CORP·Filed 2017·Granted Dec 3, 2019·0 cites·44 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →