Inventor · disambiguated record
Masayuki Yanagisawa
Also filed as: YANAGISAWA MASAYUKI
8 granted patents·1 pending application·163 citations·filing 1987–2012
86Inventor score
Top patents by PatentIndex Score
9 records- 0188US5262258AProcess of manufacturing semiconductor devicesNEC CORP·Filed 1991·Granted Nov 16, 1993·74 cites·1 claims
- 0284US7361967B2Semiconductor device with fuse wires and connection wiresNEC ELECTRONICS CORP·Filed 2005·Granted Apr 22, 2008·10 cites·11 claims
- 0374US4806457AMethod of manufacturing integrated circuit semiconductor deviceNEC CORP·Filed 1987·Granted Feb 21, 1989·46 cites·6 claims
- 0462US5187550ASemiconductor deviceNEC CORP·Filed 1992·Granted Feb 16, 1993·23 cites·3 claims
- 0544US7879532B2Method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2006·Granted Feb 1, 2011·0 cites·23 claims
- 0641US9217770B2Probe resistance measurement method and semiconductor device with pads for probe resistance measurementMICHIMATA SHIGETOMI·Filed 2012·Granted Dec 22, 2015·0 cites·6 claims
- 0737US5290711AMethod for fabricating semiconductor devices which lessens the effect of electrostatic dischargeNEC CORP·Filed 1993·Granted Mar 1, 1994·10 cites·8 claims
- 0834US8278935B2Probe resistance measurement method and semiconductor device with pads for probe resistance measurementMICHIMATA SHIGETOMI·Filed 2008·Granted Oct 2, 2012·0 cites·1 claims
- 0934US2011079834A1Semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →