Assignee
MICHIMATA SHIGETOMI
JP·2 granted patents·0 citations·filing 2008–2012
Top patents by PatentIndex Score
2 records- 0141US9217770B2Probe resistance measurement method and semiconductor device with pads for probe resistance measurementMICHIMATA SHIGETOMI·Filed 2012·Granted Dec 22, 2015·0 cites·6 claims
- 0234US8278935B2Probe resistance measurement method and semiconductor device with pads for probe resistance measurementMICHIMATA SHIGETOMI·Filed 2008·Granted Oct 2, 2012·0 cites·1 claims
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