Inventor · disambiguated record
Charles J. Montrose
Also filed as: MONTROSE CHARLES · MONTROSE CHARLES J
13 granted patents·2 pending applications·137 citations·filing 1998–2015
90Inventor score
Top patents by PatentIndex Score
15 records- 0187US6429641B1Power booster and current measuring unitIBM·Filed 2000·Granted Aug 6, 2002·42 cites·21 claims
- 0275US6437956B1Circuit for bipolar transistor stress and qualificationIBM·Filed 2000·Granted Aug 20, 2002·19 cites·15 claims
- 0374US6940285B2Method and apparatus for testing a micro electromechanical deviceIBM·Filed 2003·Granted Sep 6, 2005·18 cites·16 claims
- 0473US6429677B1Method and apparatus for characterization of gate dielectricsIBM·Filed 2000·Granted Aug 6, 2002·19 cites·4 claims
- 0558US7602265B2Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systemsIBM·Filed 2005·Granted Oct 13, 2009·2 cites·3 claims
- 0658US6598182B1Electromigration and extrusion monitor and control systemIBM·Filed 1999·Granted Jul 22, 2003·25 cites·29 claims
- 0757US9460814B2Memory tester design for soft error rate (SER) failure analysisIBM·Filed 2014·Granted Oct 4, 2016·3 cites·18 claims
- 0854US9772371B2Voltage-driven intelligent characterization bench for semiconductorGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 26, 2017·0 cites·20 claims
- 0954US6611146B2Stress testing for semiconductor devicesIBM·Filed 2001·Granted Aug 26, 2003·7 cites·7 claims
- 1044US9043179B2Voltage-driven intelligent characterization bench for semiconductorMONTROSE CHARLES J·Filed 2011·Granted May 26, 2015·0 cites·14 claims
- 1140US8615373B2Voltage driver for a voltage-driven intelligent characterization bench for semiconductorMONTROSE CHARLES J·Filed 2011·Granted Dec 24, 2013·0 cites·14 claims
- 1233US9006827B2Radiation hardened memory cell and design structuresMASSEY JOHN G·Filed 2011·Granted Apr 14, 2015·0 cites·15 claims
- 1333US2002093357A1Stress testing for semiconductor devicesIBM·Filed 2001·Application pending·0 cites
- 1431US6036358ASystem and method for diagnosing mechanical clocksIBM·Filed 1998·Granted Mar 14, 2000·2 cites·16 claims
- 1528US2012179943A1Method for information transfer in a voltage-driven intelligent characterization bench for semiconductorMONTROSE CHARLES J·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →