Inventor · disambiguated record
Noam Sapiens
Also filed as: SAPIENS NOAM
45 granted patents·8 pending applications·278 citations·filing 2010–2025
98Inventor score
Top patents by PatentIndex Score
53 records- 0198US9518916B1Compressive sensing for metrologyKLA TENCOR CORP·Filed 2014·Granted Dec 13, 2016·38 cites·29 claims
- 0297US10101676B2Spectroscopic beam profile overlay metrologyKLA TENCOR CORP·Filed 2016·Granted Oct 16, 2018·15 cites·20 claims
- 0397US10072921B2Methods and systems for spectroscopic beam profile metrology having a first two dimensional detector to detect collected light transmitted by a first wavelength dispersive elementKLA TENCOR CORP·Filed 2015·Granted Sep 11, 2018·17 cites·19 claims
- 0497US9784690B2Apparatus, techniques, and target designs for measuring semiconductor parametersKLA TENCOR CORP·Filed 2015·Granted Oct 10, 2017·14 cites·20 claims
- 0596US10401738B2Overlay metrology using multiple parameter configurationsKLA TENCOR CORP·Filed 2017·Granted Sep 3, 2019·14 cites·49 claims
- 0695US9816810B2Measurement of multiple patterning parametersKLA TENCOR CORP·Filed 2016·Granted Nov 14, 2017·11 cites·14 claims
- 0795US9739702B2Symmetric target design in scatterometry overlay metrologyKLA TENCOR CORP·Filed 2014·Granted Aug 22, 2017·31 cites·46 claims
- 0894US9490182B2Measurement of multiple patterning parametersKLA TENCOR CORP·Filed 2014·Granted Nov 8, 2016·12 cites·19 claims
- 0993US9104120B2Structured illumination for contrast enhancement in overlay metrologySELIGSON JOEL·Filed 2012·Granted Aug 11, 2015·13 cites·25 claims
- 1093US8681413B2Illumination controlMANASSEN AMNON·Filed 2011·Granted Mar 25, 2014·18 cites·42 claims
- 1192US10591406B2Symmetric target design in scatterometry overlay metrologyKLA TENCOR CORP·Filed 2016·Granted Mar 17, 2020·6 cites·20 claims
- 1292US8848186B2Angle-resolved antisymmetric scatterometryKANDEL DANIEL·Filed 2010·Granted Sep 30, 2014·8 cites·17 claims
- 1391US9739719B2Measurement systems having linked field and pupil signal detectionKLA TENCOR CORP·Filed 2015·Granted Aug 22, 2017·6 cites·20 claims
- 1490US10107765B2Apparatus, techniques, and target designs for measuring semiconductor parametersKLA TENCOR CORP·Filed 2017·Granted Oct 23, 2018·3 cites·40 claims
- 1590US9581430B2Phase characterization of targetsKLA TENCOR CORP·Filed 2013·Granted Feb 28, 2017·15 cites·12 claims
- 1689US10612916B2Measurement of multiple patterning parametersKLA TENCOR CORP·Filed 2017·Granted Apr 7, 2020·4 cites·5 claims
- 1789US8582114B2Overlay metrology by pupil phase analysisMANASSEN AMNON·Filed 2011·Granted Nov 12, 2013·7 cites·23 claims
- 1888US10365211B2Systems and methods for metrology beam stabilizationKLA TENCOR CORP·Filed 2018·Granted Jul 30, 2019·6 cites·21 claims
- 1986US9915524B2Optical metrology with small illumination spot sizeKLA TENCOR CORP·Filed 2015·Granted Mar 13, 2018·3 cites·20 claims
- 2086US9164397B2Optics symmetrization for metrologyMANASSEN AMNON·Filed 2011·Granted Oct 20, 2015·7 cites·15 claims
- 2184US10648796B2Optical metrology with small illumination spot sizeKLA TENCOR CORP·Filed 2018·Granted May 12, 2020·3 cites·13 claims
- 2283US10690602B2Methods and systems for measurement of thick films and high aspect ratio structuresKLA TENCOR CORP·Filed 2018·Granted Jun 23, 2020·3 cites·22 claims
- 2381US10663392B2Variable aperture maskKLA TENCOR CORP·Filed 2018·Granted May 26, 2020·1 cites·10 claims
- 2480US11372340B2Method and system for providing a quality metric for improved process controlKANDEL DANIEL·Filed 2012·Granted Jun 28, 2022·4 cites·22 claims
- 2580US9645079B2Structured illumination for contrast enhancement in overlay metrologyKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·2 cites·28 claims
- 2674US11707191B2Calibration and image procession methods and systems for obtaining accurate pupillary distance measurementsEYEQUE INC·Filed 2019·Granted Jul 25, 2023·2 cites·15 claims
- 2773US10588507B2Optical method to assess the refractive properties of an optical systemEYEQUE INC·Filed 2019·Granted Mar 17, 2020·2 cites·9 claims
- 2871US10062157B2Compressive sensing for metrologyKLA TENCOR CORP·Filed 2016·Granted Aug 28, 2018·1 cites·21 claims
- 2969US2023051705A1Method and System for Providing a Quality Metric for Improved Process ControlKLA CORP·Filed 2022·Application pending·0 cites
- 3068US11268901B2Variable aperture maskKLA CORP·Filed 2020·Granted Mar 8, 2022·0 cites·11 claims
- 3167US10261014B2Near field metrologyKLA TENCOR CORP·Filed 2014·Granted Apr 16, 2019·2 cites·17 claims
- 3267US9546946B2Metrology target indentification, design and verificationKLA TENCOR CORP·Filed 2014·Granted Jan 17, 2017·2 cites·16 claims
- 3366US10234271B2Method and system for spectroscopic beam profile metrology including a detection of collected light according to wavelength along a third dimension of a hyperspectral detectorKLA TENCOR CORP·Filed 2018·Granted Mar 19, 2019·0 cites·20 claims
- 3464US2025031958A1Methods and Apparatus for Addressing PresbyopiaEYEQUE INC·Filed 2024·Application pending·0 cites
- 3564US2025347583A1Methods and Systems for Automatic Measurements of Optical SystemsEYEQUE INC·Filed 2025·Application pending·0 cites
- 3662US12364390B2Methods and systems for automatic measurements of optical systemsEYEQUE INC·Filed 2022·Granted Jul 22, 2025·0 cites·5 claims
- 3762US12268447B2Means and methods of measuring refractionEYEQUE INC·Filed 2021·Granted Apr 8, 2025·0 cites·9 claims
- 3862US11119050B2Methods and systems for measurement of thick films and high aspect ratio structuresKLA CORP·Filed 2020·Granted Sep 14, 2021·0 cites·20 claims
- 3961US12114927B2Methods and apparatus for addressing presbyopiaEYEQUE INC·Filed 2021·Granted Oct 15, 2024·0 cites·10 claims
- 4061US10274425B2Structured illumination for contrast enhancement in overlay metrologyKLA TENCOR CORP·Filed 2017·Granted Apr 30, 2019·0 cites·26 claims
- 4160USD986418SMonocular optical device for automated refraction testingEYEQUE INC·Filed 2021·Granted May 16, 2023·3 cites·1 claims
- 4260US2024180417A1Vision test system for subjective refraction measurementEYEQUE INC·Filed 2023·Application pending·0 cites
- 4357US9255895B2Angle-resolved antisymmetric scatterometryKLA TENCOR CORP·Filed 2014·Granted Feb 9, 2016·0 cites·17 claims
- 4454US11503997B2Method and apparatus for measurement of a characteristic of an optical systemEYEQUE INC·Filed 2020·Granted Nov 22, 2022·0 cites·13 claims
- 4554US11497395B2Method and apparatus for modeling an eyeSAPIENS NOAM·Filed 2019·Granted Nov 15, 2022·0 cites·18 claims
- 4654US11484195B2Automated personal vision trackerSERRI JOHN·Filed 2019·Granted Nov 1, 2022·0 cites·8 claims
- 4747US2022304570A1Method and Apparatus for Measuring Vision FunctionEYEQUE INC·Filed 2020·Application pending·0 cites
- 4847US2020178793A1Refraction Measurement of the Human Eye with a Reverse Wavefront SensorEYEQUE INC·Filed 2019·Application pending·0 cites
- 4946USD933829SAutomated personal vision trackerSERRI JOHN·Filed 2018·Granted Oct 19, 2021·4 cites·1 claims
- 5044US11484196B2Method and apparatus for refraction and vision measurementEYEQUE INC·Filed 2020·Granted Nov 1, 2022·0 cites·7 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →