Inventor · disambiguated record
Richard P. Good
Also filed as: GOOD RICHARD · GOOD RICHARD P · GOOD RICHARD PAUL
20 granted patents·2 pending applications·118 citations·filing 2003–2022
93Inventor score
Files withADVANCED MICRO DEVICES INC9GLOBALFOUNDRIES INC8GLOBALFOUNDRIES US INC2GOOD RICHARD2GOOD RICHARD P1
Top patents by PatentIndex Score
22 records- 0190US7460968B1Method and apparatus for selecting wafers for samplingADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 2, 2008·15 cites·25 claims
- 0281US7330800B1Method and apparatus for selecting sites for samplingADVANCED MICRO DEVICES INC·Filed 2006·Granted Feb 12, 2008·10 cites·24 claims
- 0381US6959224B2Probability constrained optimization for electrical fabrication controlADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 25, 2005·27 cites·27 claims
- 0478US7738986B2Method and apparatus for compensating metrology data for site bias prior to filteringGLOBALFOUNDRIES INC·Filed 2006·Granted Jun 15, 2010·4 cites·17 claims
- 0578US7542880B2Time weighted moving average filterADVANCED MICRO DEVICES INC·Filed 2006·Granted Jun 2, 2009·6 cites·21 claims
- 0675US7908109B2Identifying manufacturing disturbances using preliminary electrical test dataADVANCED MICRO DEVICES INC·Filed 2008·Granted Mar 15, 2011·10 cites·21 claims
- 0774US7565254B2Method and apparatus for metrology sampling using combination sampling rulesADVANCED MICRO DEVICES INC·Filed 2006·Granted Jul 21, 2009·7 cites·26 claims
- 0873US7974801B2Method and system for a two-step prediction of a quality distribution of semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2009·Granted Jul 5, 2011·5 cites·22 claims
- 0971US8103478B2Method and system for semiconductor process control and monitoring by using PCA models of reduced sizeGOOD RICHARD·Filed 2009·Granted Jan 24, 2012·7 cites·20 claims
- 1069US10754319B1Across-wafer profile control in semiconductor processesGLOBALFOUNDRIES INC·Filed 2019·Granted Aug 25, 2020·2 cites·20 claims
- 1169US8180471B2Tuning a process controller based on a dynamic sampling rateGOOD RICHARD P·Filed 2009·Granted May 15, 2012·5 cites·18 claims
- 1269US7831324B2Method and system for randomizing wafers in a complex process lineGLOBALFOUNDRIES INC·Filed 2007·Granted Nov 9, 2010·5 cites·20 claims
- 1369US7233835B2Method and system for estimating a state of an uninitialized advanced process controller by using segregated controller dataADVANCED MICRO DEVICES INC·Filed 2006·Granted Jun 19, 2007·5 cites·14 claims
- 1465US12253472B2System and method for detecting a defect in a specimenGLOBALFOUNDRIES US INC·Filed 2022·Granted Mar 18, 2025·0 cites·18 claims
- 1563US10481592B2Selecting manufacturing settings based on historical data from manufacturing toolsGLOBALFOUNDRIES INC·Filed 2017·Granted Nov 19, 2019·1 cites·14 claims
- 1663US6985825B1Method and apparatus for adaptive sampling based on process covarianceADVANCED MICRO DEVICES INC·Filed 2003·Granted Jan 10, 2006·9 cites·21 claims
- 1749US11036912B2Overlay optimizationGLOBALFOUNDRIES US INC·Filed 2019·Granted Jun 15, 2021·0 cites·20 claims
- 1848US2009276075A1Method and system for monitoring a predicted product quality distributionGOOD RICHARD·Filed 2009·Application pending·0 cites
- 1947US10788806B2Initializing individual exposure field parameters of an overlay controllerGLOBALFOUNDRIES INC·Filed 2018·Granted Sep 29, 2020·0 cites·19 claims
- 2039US10289109B2Methods of error detection in fabrication processesGLOBALFOUNDRIES INC·Filed 2016·Granted May 14, 2019·0 cites·20 claims
- 2139US10241502B2Methods of error detection in fabrication processesGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 26, 2019·0 cites·20 claims
- 2234US2014100806A1Method and apparatus for matching tools based on time trace dataGLOBALFOUNDRIES INC·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →