Inventor · disambiguated record
Tad J. Wilder
Also filed as: WILDER TAD J · WILDER TAD JEFFREY
32 granted patents·4 pending applications·130 citations·filing 1996–2017
96Inventor score
Top patents by PatentIndex Score
36 records- 0187US9097765B1Performance screen ring oscillator formed from multi-dimensional pairings of scan chainsIBM·Filed 2014·Granted Aug 4, 2015·10 cites·20 claims
- 0286US9128151B1Performance screen ring oscillator formed from paired scan chainsIBM·Filed 2014·Granted Sep 8, 2015·6 cites·20 claims
- 0385US9383766B2Chip performance monitoring system and methodIBM·Filed 2013·Granted Jul 5, 2016·5 cites·20 claims
- 0485US7480888B1Design structure for facilitating engineering changes in integrated circuitsIBM·Filed 2008·Granted Jan 20, 2009·14 cites·3 claims
- 0584US9489482B1Reliability-optimized selective voltage binningIBM·Filed 2015·Granted Nov 8, 2016·4 cites·20 claims
- 0684US7302673B2Method and system for performing shapes correction of a multi-cell reticle photomask designIBM·Filed 2005·Granted Nov 27, 2007·7 cites·20 claims
- 0783US10539611B2Integrated circuit chip reliability qualification using a sample-specific expected fail rateIBM·Filed 2017·Granted Jan 21, 2020·2 cites·20 claims
- 0880US9639645B2Integrated circuit chip reliability using reliability-optimized failure mechanism targetingGLOBALFOUNDRIES INC·Filed 2015·Granted May 2, 2017·3 cites·20 claims
- 0980US9157956B2Adaptive power control using timing canonicalsBICKFORD JEANNE P·Filed 2012·Granted Oct 13, 2015·4 cites·24 claims
- 1080US8464199B1Circuit design using design variable function slope sensitivityCHARLEBOIS MARGARET R·Filed 2012·Granted Jun 11, 2013·7 cites·12 claims
- 1179US9188643B2Flexible performance screen ring oscillator within a scan chainIBM·Filed 2012·Granted Nov 17, 2015·4 cites·20 claims
- 1278US10006964B2Chip performance monitoring system and methodIBM·Filed 2016·Granted Jun 26, 2018·2 cites·20 claims
- 1378US8302063B2Method and system to optimize semiconductor products for power, performance, noise, and cost through use of variable power supply voltage compressionBICKFORD JEANNE P·Filed 2010·Granted Oct 30, 2012·6 cites·20 claims
- 1474US8086988B2Chip design and fabrication method optimized for profitBUCK NATHAN·Filed 2009·Granted Dec 27, 2011·7 cites·25 claims
- 1568US9618566B2Systems and methods to prevent incorporation of a used integrated circuit chip into a productGLOBALFOUNDRIES INC·Filed 2015·Granted Apr 11, 2017·1 cites·20 claims
- 1668US8060845B2Minimizing impact of design changes for integrated circuit designsHERZL ROBERT D·Filed 2008·Granted Nov 15, 2011·4 cites·6 claims
- 1767US8141028B2Structure for identifying and implementing flexible logic block logic for easy engineering changesHERZL ROBERT D·Filed 2008·Granted Mar 20, 2012·4 cites·2 claims
- 1866US7305600B2Partial good integrated circuit and method of testing sameIBM·Filed 2003·Granted Dec 4, 2007·11 cites·19 claims
- 1962US9625325B2System and method for identifying operating temperatures and modifying of integrated circuitsGLOBALFOUNDRIES INC·Filed 2015·Granted Apr 18, 2017·1 cites·20 claims
- 2061US8754696B2Ring oscillatorCHARLEBOIS MARGARET R·Filed 2012·Granted Jun 17, 2014·2 cites·16 claims
- 2159US8341588B2Semiconductor layer forming method and structureHERZL ROBERT D·Filed 2010·Granted Dec 25, 2012·1 cites·19 claims
- 2258US8381050B2Method and apparatus for increased effectiveness of delay and transition fault testingIBM·Filed 2009·Granted Feb 19, 2013·1 cites·25 claims
- 2358US8181148B2Method for identifying and implementing flexible logic block logic for easy engineering changesHERZL ROBERT D·Filed 2008·Granted May 15, 2012·1 cites·17 claims
- 2456US7478301B2Partial good integrated circuit and method of testing sameIBM·Filed 2008·Granted Jan 13, 2009·2 cites·9 claims
- 2555US9891275B2Integrated circuit chip reliability qualification using a sample-specific expected fail rateIBM·Filed 2015·Granted Feb 13, 2018·0 cites·20 claims
- 2654US7434129B2Partial good integrated circuit and method of testing sameIBM·Filed 2007·Granted Oct 7, 2008·3 cites·11 claims
- 2748US2012167022A1Method and device for identifying and implementing flexible logic block logic for easy engineering changesHERZL ROBERT D·Filed 2012·Application pending·0 cites
- 2846US2009045839A1Asic logic library of flexible logic blocks and method to enable engineering changeIBM·Filed 2007·Application pending·0 cites
- 2945US9940430B2Burn-in power performance optimizationIBM·Filed 2015·Granted Apr 10, 2018·0 cites·20 claims
- 3045US2009045836A1Asic logic library of flexible logic blocks and method to enable engineering changeHERZL ROBERT D·Filed 2007·Application pending·0 cites
- 3143US6023567AMethod and apparatus for verifying timing rules for an integrated circuit designIBM·Filed 1996·Granted Feb 8, 2000·15 cites·26 claims
- 3241US10216870B2Methodology to prevent metal lines from current pulse damageIBM·Filed 2016·Granted Feb 26, 2019·0 cites·13 claims
- 3339US10169500B2Critical path delay predictionCHARLEBOIS MARGARET R·Filed 2011·Granted Jan 1, 2019·0 cites·17 claims
- 3438US7543203B2LSSD-compatible edge-triggered shift register latchIBM·Filed 2004·Granted Jun 2, 2009·3 cites·20 claims
- 3536US2017212165A1Resistance measurement-dependent integrated circuit chip reliability estimationGLOBALFOUNDRIES INC·Filed 2016·Application pending·0 cites
- 3634US9791502B2On-chip usable life depletion meter and associated methodIBM·Filed 2015·Granted Oct 17, 2017·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →