Inventor · disambiguated record
Junqing Huang
Also filed as: HUANG JUNQING · HUANG JUNQING (JENNY)
20 granted patents·203 citations·filing 2009–2022
94Inventor score
Top patents by PatentIndex Score
20 records- 0196US9053527B2Detecting defects on a waferKLA TENCOR CORP·Filed 2013·Granted Jun 9, 2015·66 cites·51 claims
- 0295US8775101B2Detecting defects on a waferHUANG JUNQING·Filed 2011·Granted Jul 8, 2014·70 cites·18 claims
- 0393US8223327B2Systems and methods for detecting defects on a waferCHEN LU·Filed 2009·Granted Jul 17, 2012·24 cites·24 claims
- 0488US11270430B2Wafer inspection using difference imagesKLA TENCOR CORP·Filed 2018·Granted Mar 8, 2022·5 cites·18 claims
- 0587US10605744B2Systems and methods for detecting defects on a waferKLA TENCOR CORP·Filed 2018·Granted Mar 31, 2020·3 cites·3 claims
- 0687US9224660B2Tuning wafer inspection recipes using precise defect locationsKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·7 cites·39 claims
- 0786US9880107B2Systems and methods for detecting defects on a waferKLA TENCOR CORP·Filed 2013·Granted Jan 30, 2018·5 cites·44 claims
- 0885US8467047B2Systems and methods for detecting defects on a waferCHEN LU·Filed 2012·Granted Jun 18, 2013·5 cites·17 claims
- 0979US11308606B2Design-assisted inspection for DRAM and 3D NAND devicesKLA CORP·Filed 2019·Granted Apr 19, 2022·2 cites·8 claims
- 1079US9619876B2Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modesKLA TENCOR CORP·Filed 2013·Granted Apr 11, 2017·3 cites·27 claims
- 1178US10923317B2Detecting defects in a logic region on a waferKLA CORP·Filed 2019·Granted Feb 16, 2021·2 cites·21 claims
- 1277US10395359B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·2 cites·23 claims
- 1371US11783470B2Design-assisted inspection for DRAM and 3D NAND devicesKLA CORP·Filed 2022·Granted Oct 10, 2023·0 cites·18 claims
- 1470US9704234B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2014·Granted Jul 11, 2017·2 cites·35 claims
- 1569US10599944B2Visual feedback for inspection algorithms and filtersKLA TENCOR CORP·Filed 2012·Granted Mar 24, 2020·2 cites·25 claims
- 1661US8989479B2Region based virtual fourier filterGAO LISHENG·Filed 2011·Granted Mar 24, 2015·3 cites·35 claims
- 1760US9442077B2Scratch filter for wafer inspectionKLA TENCOR CORP·Filed 2014·Granted Sep 13, 2016·1 cites·38 claims
- 1859US8059886B2Adaptive signature detectionGAO YONG·Filed 2010·Granted Nov 15, 2011·1 cites·17 claims
- 1945US10600177B2Nuisance reduction using location-based attributesKLA TENCOR CORP·Filed 2017·Granted Mar 24, 2020·0 cites·19 claims
- 2038US10339262B2System and method for defining care areas in repeating structures of design dataKLA TENCOR CORP·Filed 2016·Granted Jul 2, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →