Inventor · disambiguated record
Shay Assaf
Also filed as: ASSAF SHAY
12 granted patents·34 citations·filing 2008–2023
86Inventor score
Top patents by PatentIndex Score
12 records- 0198US11581203B2Systems for integrating load locks into a factory interface footprint spaceAPPLIED MATERIALS INC·Filed 2021·Granted Feb 14, 2023·7 cites·14 claims
- 0292US11232965B2Transport systemAPPLIED MATERIALS INC·Filed 2019·Granted Jan 25, 2022·9 cites·20 claims
- 0383US10361104B2Ambient controlled transfer module and process systemAPPLIED MATERIALS INC·Filed 2017·Granted Jul 23, 2019·3 cites·13 claims
- 0477US10665494B2Automated apparatus to temporarily attach substrates to carriers without adhesives for processingAPPLIED MATERIALS INC·Filed 2018·Granted May 26, 2020·3 cites·20 claims
- 0574US9959610B2System and method to detect substrate and/or substrate support misalignment using imagingAPPLIED MATERIALS INC·Filed 2015·Granted May 1, 2018·2 cites·16 claims
- 0671US12159796B2Systems and methods for integrating load locks into a factory interface footprint spaceAPPLIED MATERIALS INC·Filed 2023·Granted Dec 3, 2024·0 cites·22 claims
- 0771US8527080B2Method and system for managing process jobs in a semiconductor fabrication facilityASSAF SHAY·Filed 2008·Granted Sep 3, 2013·10 cites·20 claims
- 0865US11894251B2Transport systemAPPLIED MATERIALS INC·Filed 2022·Granted Feb 6, 2024·0 cites·20 claims
- 0957US12142508B2Factory interface robots usable with integrated load locksAPPLIED MATERIALS INC·Filed 2021·Granted Nov 12, 2024·0 cites·17 claims
- 1056US10818525B2Ambient controlled transfer module and process systemAPPLIED MATERIALS INC·Filed 2019·Granted Oct 27, 2020·0 cites·20 claims
- 1150US11204312B2In-situ full wafer metrology systemAPPLIED MATERIALS INC·Filed 2020·Granted Dec 21, 2021·0 cites·17 claims
- 1249US11817332B2Multi-wafer volume single transfer chamber facetAPPLIED MATERIALS INC·Filed 2020·Granted Nov 14, 2023·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →