Inventor · disambiguated record
Michael R. Ouellette
Also filed as: OUELLETTE MICHAEL R · OUELLETTE MICHAEL RICHARD
119 granted patents·10 pending applications·1,335 citations·filing 1995–2019
99Inventor score
Top patents by PatentIndex Score
129 records- 0195US8537627B2Determining fusebay storage element usageOUELLETTE MICHAEL R·Filed 2011·Granted Sep 17, 2013·41 cites·20 claims
- 0295US7251756B2Method and apparatus for increasing fuse programming yield through preferred use of duplicate dataIBM·Filed 2005·Granted Jul 31, 2007·51 cites·30 claims
- 0395US6577156B2Method and apparatus for initializing an integrated circuit using compressed data from a remote fuseboxIBM·Filed 2000·Granted Jun 10, 2003·106 cites·28 claims
- 0494US8719648B2Interleaving of memory repair data compression and fuse programming operations in single fusebay architectureGORMAN KEVIN W·Filed 2011·Granted May 6, 2014·35 cites·24 claims
- 0593US8484543B2Fusebay controller structure, system, and methodANAND DARREN L·Filed 2011·Granted Jul 9, 2013·28 cites·20 claims
- 0692US7170299B1Electronic fuse blow mimic and methods for adjusting electronic fuse blowIBM·Filed 2006·Granted Jan 30, 2007·25 cites·20 claims
- 0792US6768694B2Method of electrically blowing fuses under control of an on-chip tester interface apparatusIBM·Filed 2002·Granted Jul 27, 2004·84 cites·44 claims
- 0888US7098721B2Low voltage programmable eFuse with differential sensing schemeIBM·Filed 2004·Granted Aug 29, 2006·48 cites·20 claims
- 0987US9881694B2Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2015·Granted Jan 30, 2018·6 cites·20 claims
- 1087US7721119B2System and method to optimize multi-core microprocessor performance using voltage offsetsIBM·Filed 2006·Granted May 18, 2010·20 cites·30 claims
- 1187US7458000B2Automatic shutdown or throttling of a bist state machine using thermal feedbackIBM·Filed 2006·Granted Nov 25, 2008·20 cites·19 claims
- 1286US7174486B2Automation of fuse compression for an ASIC design systemIBM·Filed 2002·Granted Feb 6, 2007·33 cites·18 claims
- 1386US5912901AMethod and built-in self-test apparatus for testing an integrated circuit which capture failure information for a selected failureIBM·Filed 1997·Granted Jun 15, 1999·85 cites·11 claims
- 1484US6856569B2Method and system for merging multiple fuse decompression serial bitstreams to support auxiliary fuseblow capabilityIBM·Filed 2003·Granted Feb 15, 2005·35 cites·26 claims
- 1584US5825785ASerial input shift register built-in self test circuit for embedded circuitsINTERNAITONAL BUSINESS MACHINE·Filed 1996·Granted Oct 20, 1998·63 cites·16 claims
- 1683US6658610B1Compilable address magnitude comparator for memory array self-testingIBM·Filed 2000·Granted Dec 2, 2003·23 cites·13 claims
- 1782US8935586B2Staggered start of BIST controllers and BIST enginesIBM·Filed 2012·Granted Jan 13, 2015·6 cites·24 claims
- 1882US6928377B2Self-test architecture to implement data column redundancy in a RAMIBM·Filed 2003·Granted Aug 9, 2005·33 cites·15 claims
- 1981US8188765B2Circuit and method for asynchronous pipeline processing with variable request signal delayOUELLETTE MICHAEL R·Filed 2010·Granted May 29, 2012·7 cites·20 claims
- 2081US7607060B2System and method for performing high speed memory diagnostics via built-in-self-testIBM·Filed 2006·Granted Oct 20, 2009·13 cites·20 claims
- 2179US8914688B2System and method of reducing test time via address aware BIST circuitryIBM·Filed 2012·Granted Dec 16, 2014·8 cites·25 claims
- 2279US7908534B2Diagnosable general purpose test registers scan chain designIBM·Filed 2008·Granted Mar 15, 2011·9 cites·6 claims
- 2379US7895028B2Structure for increasing fuse programming yieldIBM·Filed 2007·Granted Feb 22, 2011·11 cites·8 claims
- 2479US7073112B2Compilable address magnitude comparator for memory array self-testingIBM·Filed 2003·Granted Jul 4, 2006·19 cites·6 claims
- 2578US7870454B2Structure for system for and method of performing high speed memory diagnostics via built-in-self-testIBM·Filed 2008·Granted Jan 11, 2011·9 cites·8 claims
- 2678US6993692B2Method, system and apparatus for aggregating failures across multiple memories and applying a common defect repair solution to all of the multiple memoriesIBM·Filed 2003·Granted Jan 31, 2006·25 cites·21 claims
- 2777US7310278B2Method and apparatus for in-system redundant array repair on integrated circuitsIBM·Filed 2006·Granted Dec 18, 2007·8 cites·8 claims
- 2877US7251757B2Memory testingIBM·Filed 2003·Granted Jul 31, 2007·24 cites·24 claims
- 2976US7735031B2Method and apparatus for self identification of circuitryIBM·Filed 2007·Granted Jun 8, 2010·8 cites·17 claims
- 3076US6944075B1Variable column redundancy region boundaries in SRAMIBM·Filed 2005·Granted Sep 13, 2005·10 cites·20 claims
- 3176US6505324B1Automated fuse blow software systemIBM·Filed 2000·Granted Jan 7, 2003·28 cites·27 claims
- 3275US8656325B2Integrated circuit design method and systemBARWIN JOHN E·Filed 2012·Granted Feb 18, 2014·5 cites·14 claims
- 3375US6363023B2Bi-directional differential low power sense amp and memory systemIBM·Filed 2001·Granted Mar 26, 2002·20 cites·8 claims
- 3474US7930592B2Enabling memory redundancy during testingIBM·Filed 2007·Granted Apr 19, 2011·9 cites·12 claims
- 3573US6922649B2Multiple on-chip test runs and repairs for memoriesIBM·Filed 2003·Granted Jul 26, 2005·20 cites·20 claims
- 3673US6002633APerformance optimizing compiler for building a compiled SRAMIBM·Filed 1999·Granted Dec 14, 1999·33 cites·39 claims
- 3772US8839054B2Read only memory (ROM) with redundancyBRACERAS GEORGE M·Filed 2012·Granted Sep 16, 2014·4 cites·13 claims
- 3872US8467260B2Structure and method for storing multiple repair pass data into a fusebayGORMAN KEVIN W·Filed 2011·Granted Jun 18, 2013·5 cites·20 claims
- 3972US7477555B2System and method for differential eFUSE sensing without reference fusesIBM·Filed 2006·Granted Jan 13, 2009·8 cites·12 claims
- 4071US9460811B2Read only memory (ROM) with redundancyIBM·Filed 2014·Granted Oct 4, 2016·2 cites·8 claims
- 4170US8612813B2Circuit and method for efficient memory repairIBM·Filed 2013·Granted Dec 17, 2013·3 cites·14 claims
- 4270US8239818B1Data structure for describing MBIST architectureMONROE CRAIG M·Filed 2011·Granted Aug 7, 2012·5 cites·12 claims
- 4370US6920525B2Method and apparatus of local word-line redundancy in CAMIBM·Filed 2002·Granted Jul 19, 2005·18 cites·11 claims
- 4470US5710742AHigh density two port SRAM cell for low voltage CMOS applicationsIBM·Filed 1995·Granted Jan 20, 1998·31 cites·18 claims
- 4569US6961276B2Random access memory having an adaptable latencyIBM·Filed 2003·Granted Nov 1, 2005·18 cites·22 claims
- 4668US10971243B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 6, 2021·1 cites·20 claims
- 4767US9734920B2Memory test with in-line error correction code logic to test memory data and test the error correction code logic surrounding the memoriesIBM·Filed 2015·Granted Aug 15, 2017·2 cites·17 claims
- 4867US8918690B2Decreasing power supply demand during BIST initializationsIBM·Filed 2013·Granted Dec 23, 2014·3 cites·20 claims
- 4967US8471595B1Selectable dynamic/static latch with embedded logicAUSTIN JOHN S·Filed 2012·Granted Jun 25, 2013·3 cites·12 claims
- 5067US6333872B1Self-test method for testing read stability in a dual-port SRAM cellIBM·Filed 2000·Granted Dec 25, 2001·16 cites·20 claims
Showing the top 50 of 129 patent records by PatentIndex Score.
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