Inventor · disambiguated record
Michal Hrouzek
Also filed as: HROUZEK MICHAL
5 granted patents·3 pending applications·3 citations·filing 2007–2025
63Inventor score
Top patents by PatentIndex Score
8 records- 0173US9741527B2Specimen holder for a charged particle microscopeFEI CO·Filed 2015·Granted Aug 22, 2017·3 cites·20 claims
- 0268US12228484B2Broad ion beam (BIB) systems for more efficient processing of multiple samplesFEI CO·Filed 2022·Granted Feb 18, 2025·0 cites·19 claims
- 0368US2025321164A1Broad ion beam (bib) systems for more efficient processing of multiple samplesFEI CO·Filed 2025·Application pending·0 cites
- 0457US12165833B2System and methods for automated processing of multiple samples in a BIB systemFEI CO·Filed 2022·Granted Dec 10, 2024·0 cites·20 claims
- 0554US12106931B2Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) systemFEI CO·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 0645US2023420216A1Combined laser and broad ion beam (bib) systems for more efficient processing of multiple samplesFEI CO·Filed 2022·Application pending·0 cites
- 0737US10475629B2Charged-particle microscope with in situ deposition functionalityFEI CO·Filed 2016·Granted Nov 12, 2019·0 cites·16 claims
- 0827US2010064397A1Controlled atomic force microscopeUNIV JOSEPH FOURIER·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →