Inventor · disambiguated record
Masayuki Hachiya
Also filed as: HACHIYA MASAYUKI
9 granted patents·1 pending application·27 citations·filing 2006–2012
84Inventor score
Top patents by PatentIndex Score
10 records- 0189US7719669B2Surface inspection method and surface inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 18, 2010·13 cites·20 claims
- 0277US8305568B2Surface inspection method and surface inspection apparatusMATSUI SHIGERU·Filed 2011·Granted Nov 6, 2012·3 cites·18 claims
- 0374US8310667B2Wafer surface inspection apparatus and wafer surface inspection methodZAMA KAZUHIRO·Filed 2008·Granted Nov 13, 2012·4 cites·45 claims
- 0472US7916287B2Surface inspection method and surface inspection apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·2 cites·10 claims
- 0572US7420668B2Wafer surface inspection apparatus and wafer surface inspection methodHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 2, 2008·3 cites·6 claims
- 0658US8203705B2Inspection apparatus and inspection methodOOYAMA MASAMI·Filed 2009·Granted Jun 19, 2012·2 cites·40 claims
- 0751US2007211241A1Optical defect inspection apparatusAIZAWA NORIYUKI·Filed 2007·Application pending·0 cites
- 0847US8472016B2Optical defect inspection apparatusIIJIMA YUUICHIRO·Filed 2012·Granted Jun 25, 2013·0 cites·18 claims
- 0944US8184283B2Optical defect inspection apparatusIIJIMA YUUICHIRO·Filed 2010·Granted May 22, 2012·0 cites·19 claims
- 1042US8537351B2Inspection apparatus and inspection methodOOYAMA MASAMI·Filed 2012·Granted Sep 17, 2013·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →