Assignee
MATSUI SHIGERU
JP·7 granted patents·4 pending applications·10 citations·filing 2005–2012
Top patents by PatentIndex Score
11 records- 0184US8248594B2Surface inspection method and surface inspection apparatusMATSUI SHIGERU·Filed 2010·Granted Aug 21, 2012·4 cites·20 claims
- 0279US8160352B2Surface inspection method and surface inspection apparatusMATSUI SHIGERU·Filed 2010·Granted Apr 17, 2012·2 cites·14 claims
- 0377US8305568B2Surface inspection method and surface inspection apparatusMATSUI SHIGERU·Filed 2011·Granted Nov 6, 2012·3 cites·18 claims
- 0470US8493557B2Surface inspecting apparatus and surface inspecting methodMATSUI SHIGERU·Filed 2010·Granted Jul 23, 2013·1 cites·10 claims
- 0560US8878119B2Optical inspection method and optical inspection apparatusMATSUI SHIGERU·Filed 2012·Granted Nov 4, 2014·0 cites·16 claims
- 0659US8743357B2Light source device, surface inspecting apparatus using the device, and method for calibrating surface inspecting apparatus using the deviceMATSUI SHIGERU·Filed 2009·Granted Jun 3, 2014·0 cites·38 claims
- 0759US2012176611A1Surface inspection method and surface inspection apparatusMATSUI SHIGERU·Filed 2012·Application pending·0 cites
- 0858US8243263B2Optical inspection method and optical inspection apparatusMATSUI SHIGERU·Filed 2011·Granted Aug 14, 2012·0 cites·60 claims
- 0944US2006072106A1Image viewing method for microstructures and defect inspection system using itMATSUI SHIGERU·Filed 2005·Application pending·0 cites
- 1039US2013107255A1SpectrophotometerMATSUI SHIGERU·Filed 2011·Application pending·0 cites
- 1134US2013222789A1SpectrophotometerMATSUI SHIGERU·Filed 2011·Application pending·0 cites
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