Inventor · disambiguated record
Norihiro Ota
Also filed as: OTA NORIHIRO
18 granted patents·5 pending applications·72 citations·filing 1982–2021
91Inventor score
Top patents by PatentIndex Score
23 records- 0189US10914758B2Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jigNIDEC READ CORP·Filed 2017·Granted Feb 9, 2021·4 cites·9 claims
- 0289US10649005B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 12, 2020·4 cites·20 claims
- 0385US10649004B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2018·Granted May 12, 2020·3 cites·18 claims
- 0480US4532632ATunable semiconductor laserOMRON TATEISI ELECTRONICS CO·Filed 1982·Granted Jul 30, 1985·23 cites·13 claims
- 0574US10656179B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 19, 2020·1 cites·20 claims
- 0673US10877085B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2017·Granted Dec 29, 2020·2 cites·13 claims
- 0768US10782317B2Contact probeNIDEC READ CORP·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 0861US9733299B2Inspection jigNIDEC-READ CORP·Filed 2014·Granted Aug 15, 2017·2 cites·20 claims
- 0961US4491384AOptical switch deviceOMRON TATEISI ELECTRONICS CO·Filed 1982·Granted Jan 1, 1985·20 cites·10 claims
- 1060US11415599B2Contact probe and electrical connection jigNIDEC READ CORP·Filed 2017·Granted Aug 16, 2022·0 cites·20 claims
- 1153US12135336B2Contact, inspection jig, inspection device, and method of manufacturing contactNIDEC READ CORP·Filed 2020·Granted Nov 5, 2024·0 cites·19 claims
- 1252US12055561B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Aug 6, 2024·0 cites·20 claims
- 1351US12055562B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·20 claims
- 1449US12013416B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Jun 18, 2024·0 cites·20 claims
- 1548US4595253AParallel-to-serial conversion of optical data using acousto-optical diffractionOMRON TATEISI ELECTRONICS CO·Filed 1985·Granted Jun 17, 1986·13 cites·15 claims
- 1647US2020200797A1Inspection jig, method for manufacturing inspection jig, and inspection apparatus including inspection jigNIDEC READ CORP·Filed 2019·Application pending·0 cites
- 1746US11327094B2Inspection jig, and inspection device including the sameNIDEC READ CORP·Filed 2019·Granted May 10, 2022·0 cites·14 claims
- 1846US2023349946A1Tubular body, contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2021·Application pending·0 cites
- 1945US2022026481A1Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2019·Application pending·0 cites
- 2045US2022178968A1Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Application pending·0 cites
- 2143US10877069B2Inspection jig, substrate inspection device, and method for manufacturing inspection jigNIDEC READ CORP·Filed 2017·Granted Dec 29, 2020·0 cites·14 claims
- 2239US2020300930A1Method for producing mi element and mi elementNIDEC READ CORP·Filed 2018·Application pending·0 cites
- 2336US11467186B2Inspection jig, inspection device, and contact terminalNIDEC READ CORP·Filed 2019·Granted Oct 11, 2022·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →