Assignee
NIDEC READ CORP
JP·65 granted patents·19 pending applications·325 citations·filing 1997–2023
Top patents by PatentIndex Score
84 records- 0189US10914758B2Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jigNIDEC READ CORP·Filed 2017·Granted Feb 9, 2021·4 cites·9 claims
- 0289US10649005B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 12, 2020·4 cites·20 claims
- 0385US12092662B2Clamp-type AC voltage probeNIDEC READ CORP·Filed 2021·Granted Sep 17, 2024·1 cites·20 claims
- 0485US10649004B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2018·Granted May 12, 2020·3 cites·18 claims
- 0584US11830670B2Coiled electronic componentNIDEC READ CORP·Filed 2022·Granted Nov 28, 2023·0 cites·6 claims
- 0683US6097202ACircuit board inspection apparatus and methodNIDEC READ CORP·Filed 1998·Granted Aug 1, 2000·53 cites·22 claims
- 0782US6411079B1Printed circuit board testing apparatus with dedicated test head and versatile-use test headNIDEC READ CORP·Filed 2000·Granted Jun 25, 2002·26 cites·10 claims
- 0880US6459272B1Apparatus and method for inspecting wiring on boardNIDEC READ CORP·Filed 2000·Granted Oct 1, 2002·28 cites·30 claims
- 0979US6486689B1Printed circuit board testing apparatus and probe device for use in the sameNIDEC READ CORP·Filed 2000·Granted Nov 26, 2002·23 cites·6 claims
- 1075US6777949B2Circuit board testing apparatus and method for testing a circuit boardNIDEC READ CORP·Filed 2002·Granted Aug 17, 2004·18 cites·37 claims
- 1174US10656179B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 19, 2020·1 cites·20 claims
- 1273US10877085B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2017·Granted Dec 29, 2020·2 cites·13 claims
- 1372US5969530ACircuit board inspection apparatus and method employing a rapidly changing electrical parameter signalNIDEC READ CORP·Filed 1998·Granted Oct 19, 1999·36 cites·23 claims
- 1470US7202690B2Substrate inspection device and substrate inspecting methodNIDEC READ CORP·Filed 2005·Granted Apr 10, 2007·6 cites·21 claims
- 1569US11953314B2Imaging device, bump inspection device, and imaging methodNIDEC READ CORP·Filed 2023·Granted Apr 9, 2024·0 cites·6 claims
- 1669US10962569B2Probe, inspection jig, inspection device, and method of manufacturing probeNIDEC READ CORP·Filed 2019·Granted Mar 30, 2021·1 cites·20 claims
- 1769US6462556B2Circuit board testing apparatus and methodNIDEC READ CORP·Filed 2001·Granted Oct 8, 2002·17 cites·16 claims
- 1868US11527341B2Coiled electronic component, coil component, manufacturing method of coil component, inductance element, T-type filter, oscillation circuit, and manufacturing method of inductanceNIDEC READ CORP·Filed 2018·Granted Dec 13, 2022·0 cites·9 claims
- 1968US10782317B2Contact probeNIDEC READ CORP·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 2068US9606166B2Insulation inspection apparatus and insulation inspection methodNIDEC-READ CORP·Filed 2014·Granted Mar 28, 2017·2 cites·5 claims
- 2167US11009523B2Probe, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2019·Granted May 18, 2021·1 cites·20 claims
- 2264US11408915B2Cylindrical body and method for producing sameNIDEC READ CORP·Filed 2019·Granted Aug 9, 2022·0 cites·8 claims
- 2363US11953562B2MI sensor and method for manufacturing MI sensorNIDEC READ CORP·Filed 2019·Granted Apr 9, 2024·0 cites·9 claims
- 2463US6316949B1Apparatus and method for testing electric conductivity of circuit path ways on circuit boardNIDEC READ CORP·Filed 2000·Granted Nov 13, 2001·12 cites·24 claims
- 2562US9678134B2Method for determining maintenance time for contacts, and testing apparatusNIDEC-READ CORP·Filed 2014·Granted Jun 13, 2017·1 cites·3 claims
- 2661US9910084B2Flexible circuit board inspecting apparatusNIDEC READ CORP·Filed 2015·Granted Mar 6, 2018·1 cites·20 claims
- 2761US9733299B2Inspection jigNIDEC-READ CORP·Filed 2014·Granted Aug 15, 2017·2 cites·20 claims
- 2861US6356093B2Printed circuit board testing apparatusNIDEC READ CORP·Filed 1999·Granted Mar 12, 2002·29 cites·15 claims
- 2960US11933837B2Inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Mar 19, 2024·0 cites·20 claims
- 3060US11415599B2Contact probe and electrical connection jigNIDEC READ CORP·Filed 2017·Granted Aug 16, 2022·0 cites·20 claims
- 3159US12072352B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2020·Granted Aug 27, 2024·0 cites·20 claims
- 3256US2020257388A1Inspecting apparatusNIDEC-READ CORP·Filed 2020·Application pending·0 cites
- 3354US11454650B2Probe, inspection jig, inspection device, and method for manufacturing probeNIDEC READ CORP·Filed 2019·Granted Sep 27, 2022·0 cites·18 claims
- 3454US7112967B2Circuit based testing apparatus and method for testing a circuit boardNIDEC READ CORP·Filed 2004·Granted Sep 26, 2006·6 cites·19 claims
- 3553US12135336B2Contact, inspection jig, inspection device, and method of manufacturing contactNIDEC READ CORP·Filed 2020·Granted Nov 5, 2024·0 cites·19 claims
- 3653US12131460B2Image processing apparatus, image processing method, and inspection apparatusNIDEC READ CORP·Filed 2022·Granted Oct 29, 2024·0 cites·19 claims
- 3753US6353327B2Circuit board misalignment detection apparatus and methodNIDEC READ CORP·Filed 1998·Granted Mar 5, 2002·17 cites·8 claims
- 3852US12158480B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2021·Granted Dec 3, 2024·0 cites·20 claims
- 3952US12055561B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Aug 6, 2024·0 cites·20 claims
- 4052US10678385B2Inspecting apparatusNIDEC READ CORP·Filed 2017·Granted Jun 9, 2020·0 cites·5 claims
- 4151US12055579B2Inspection jig and circuit board inspection apparatus including the sameNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·19 claims
- 4251US12055562B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·20 claims
- 4351US11940482B2Inspection deviceNIDEC READ CORP·Filed 2020·Granted Mar 26, 2024·0 cites·11 claims
- 4451US2015086303A1Processing object transport system, and substrate inspection systemNIDEC READ CORP·Filed 2014·Application pending·0 cites
- 4550US12055580B2Circuit board inspecting apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·12 claims
- 4650US11977100B2Inspection jigNIDEC READ CORP·Filed 2020·Granted May 7, 2024·0 cites·20 claims
- 4749US12055615B2Detection value correction system, coefficient calculation method, and detection value correction methodNIDEC READ CORP·Filed 2020·Granted Aug 6, 2024·0 cites·14 claims
- 4849US12013416B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Jun 18, 2024·0 cites·20 claims
- 4949US9753075B2Inspection apparatus and inspection methodNIDEC-READ CORP·Filed 2014·Granted Sep 5, 2017·0 cites·11 claims
- 5048USD1065962SJigNIDEC READ CORP·Filed 2020·Granted Mar 11, 2025·1 cites·1 claims
Showing the top 50 of 84 patent records by PatentIndex Score.
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