Inventor · disambiguated record
John M. Safran
Also filed as: SAFRAN JOHN · SAFRAN JOHN M · SAFRAN JOHN MATTHEW
34 granted patents·3 pending applications·376 citations·filing 1996–2023
97Inventor score
Files withIBM25GLOBALFOUNDRIES INC4KOTHANDARAMAN CHANDRASEKHARAN2CESTERO ALBERTO1COOLBAUGH DOUGLAS D1
Top patents by PatentIndex Score
37 records- 0196US7714326B2Electrical antifuse with integrated sensorIBM·Filed 2007·Granted May 11, 2010·47 cites·20 claims
- 0295US7700993B2CMOS EPROM and EEPROM devices and programmable CMOS invertersIBM·Filed 2007·Granted Apr 20, 2010·42 cites·25 claims
- 0395US7254078B1System and method for increasing reliability of electrical fuse programmingIBM·Filed 2006·Granted Aug 7, 2007·41 cites·21 claims
- 0494US7307911B1Apparatus and method for improving sensing margin of electrically programmable fusesIBM·Filed 2006·Granted Dec 11, 2007·30 cites·20 claims
- 0592US7817455B2Random access electrically programmable e-fuse ROMIBM·Filed 2006·Granted Oct 19, 2010·31 cites·35 claims
- 0688US7723820B2Transistor based antifuse with integrated heating elementIBM·Filed 2006·Granted May 25, 2010·17 cites·8 claims
- 0788US7432755B1Programming current stabilized electrical fuse programming circuit and methodIBM·Filed 2007·Granted Oct 7, 2008·20 cites·2 claims
- 0887US8159040B2Metal gate integration structure and method including metal fuse, anti-fuse and/or resistorCOOLBAUGH DOUGLAS D·Filed 2008·Granted Apr 17, 2012·15 cites·21 claims
- 0986US9891261B2Electromigration monitorIBM·Filed 2014·Granted Feb 13, 2018·6 cites·10 claims
- 1086US8361887B2Method of programming electrical antifuseIBM·Filed 2012·Granted Jan 29, 2013·7 cites·8 claims
- 1184US7674691B2Method of manufacturing an electrical antifuseIBM·Filed 2007·Granted Mar 9, 2010·10 cites·6 claims
- 1280US9029234B2Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stackingSAFRAN JOHN MATTHEW·Filed 2012·Granted May 12, 2015·8 cites·26 claims
- 1380US8350264B2Secure anti-fuse with low voltage programming through localized diffusion heatingINTERNAT BUSINESSS MACHINES CORP·Filed 2010·Granted Jan 8, 2013·5 cites·20 claims
- 1478US7139990B2Method of checking the layout versus the schematic of multi-fingered MOS transistor layouts using a sub-circuit based extractionIBM·Filed 2004·Granted Nov 21, 2006·29 cites·15 claims
- 1577US7345904B1Method for programming an electronically programmable semiconductor fuseIBM·Filed 2006·Granted Mar 18, 2008·7 cites·9 claims
- 1675US5909658AHigh speed electron beam lithography pattern processing systemIBM·Filed 1996·Granted Jun 1, 1999·38 cites·18 claims
- 1773US10199315B2Post zero via layer keep out zone over through silicon via reducing BEOL pumping effectsGLOBALFOUNDRIES INC·Filed 2016·Granted Feb 5, 2019·2 cites·15 claims
- 1872US9404953B2Structures and methods for monitoring dielectric reliability with through-silicon viasIBM·Filed 2013·Granted Aug 2, 2016·2 cites·12 claims
- 1972US8004060B2Metal gate compatible electrical antifuseIBM·Filed 2007·Granted Aug 23, 2011·5 cites·8 claims
- 2072US7609577B2Design structure for improving sensing margin of electrically programmable fusesIBM·Filed 2007·Granted Oct 27, 2009·6 cites·10 claims
- 2167US12449596B2Optical input/output interfaces between photonics chipsGLOBALFOUNDRIES US INC·Filed 2023·Granted Oct 21, 2025·0 cites·19 claims
- 2265US9177923B2Through-substrate via shieldingIBM·Filed 2014·Granted Nov 3, 2015·1 cites·11 claims
- 2364US7764531B2Implementing precise resistance measurement for 2D array efuse bit cell using differential sense amplifier, balanced bitlines, and programmable reference resistorIBM·Filed 2008·Granted Jul 27, 2010·5 cites·20 claims
- 2459US8115275B2Electrical antifuseCESTERO ALBERTO·Filed 2009·Granted Feb 14, 2012·2 cites·8 claims
- 2558US10677833B2Electromigration monitorIBM·Filed 2017·Granted Jun 9, 2020·0 cites·12 claims
- 2656US10794948B2Electromigration monitorIBM·Filed 2017·Granted Oct 6, 2020·0 cites·11 claims
- 2754US10446484B2Through-silicon via with improved substrate contact for reduced through-silicon via (TSV) capacitance variabilityGLOBALFOUNDRIES INC·Filed 2017·Granted Oct 15, 2019·0 cites·15 claims
- 2852US9847290B1Through-silicon via with improved substrate contact for reduced through-silicon via (TSV) capacitance variabilityGLOBALFOUNDRIES INC·Filed 2016·Granted Dec 19, 2017·0 cites·13 claims
- 2952US9070698B2Through-substrate via shieldingIBM·Filed 2012·Granted Jun 30, 2015·0 cites·20 claims
- 3049US8569755B2Secure anti-fuse with low voltage programming through localized diffusion heatingLi yan zun·Filed 2012·Granted Oct 29, 2013·0 cites·14 claims
- 3149US8519507B2Electrically programmable fuse using anisometric contacts and fabrication methodKOTHANDARAMAN CHANDRASEKHARAN·Filed 2009·Granted Aug 27, 2013·0 cites·11 claims
- 3246US2016148863A1Non-contiguous dummy structure surrounding through-substrate via near integrated circuit wiresIBM·Filed 2014·Application pending·0 cites
- 3345US8629049B2Electrically programmable fuse using anisometric contacts and fabrication methodKOTHANDARAMAN CHANDRASEKHARAN·Filed 2012·Granted Jan 14, 2014·0 cites·7 claims
- 3443US2009108400A1Anti-fuse structure including a sense pad contact region and methods for fabrication and programming thereofIBM·Filed 2007·Application pending·0 cites
- 3542US7525831B2Method for improving sensing margin of electrically programmable fusesIBM·Filed 2007·Granted Apr 28, 2009·0 cites·7 claims
- 3639US9953900B2Transistor structures gated using a conductor-filled via or trenchGLOBALFOUNDRIES INC·Filed 2016·Granted Apr 24, 2018·0 cites·15 claims
- 3736US2008218247A1Method for automatically adjusting electrical fuse programming voltageIBM·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →