Inventor · disambiguated record
Srinivas Doddi
Also filed as: DODDI SRINIVAS · DODDI SRINIVAS RAO
25 granted patents·2 pending applications·688 citations·filing 2000–2022
97Inventor score
Top patents by PatentIndex Score
27 records- 0197US6609086B1Profile refinement for integrated circuit metrologyTIMBRE TECH INC·Filed 2002·Granted Aug 19, 2003·113 cites·76 claims
- 0295US11733996B2Intelligent software patch managementVMWARE INC·Filed 2022·Granted Aug 22, 2023·4 cites·20 claims
- 0395US10389742B2Security feature extraction for a networkVMWARE INC·Filed 2016·Granted Aug 20, 2019·117 cites·24 claims
- 0495US7330279B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2002·Granted Feb 12, 2008·58 cites·52 claims
- 0594US10630706B2Modeling behavior in a networkVMWARE INC·Filed 2016·Granted Apr 21, 2020·29 cites·24 claims
- 0694US7831528B2Optical metrology of structures formed on semiconductor wafers using machine learning systemsTOKYO ELECTRON LTD·Filed 2009·Granted Nov 9, 2010·29 cites·29 claims
- 0792US8561184B1System, method and computer program product for comprehensive collusion detection and network traffic quality predictionMARSA ROBERT LEE·Filed 2010·Granted Oct 15, 2013·64 cites·20 claims
- 0892US8533825B1System, method and computer program product for collusion detectionMARSA ROBERT LEE·Filed 2010·Granted Sep 10, 2013·53 cites·21 claims
- 0992US6636843B2System and method for grating profile classificationTIMBRE TECH INC·Filed 2000·Granted Oct 21, 2003·44 cites·11 claims
- 1091US10305922B2Detecting security threats in a local networkVMWARE INC·Filed 2016·Granted May 28, 2019·16 cites·20 claims
- 1186US8677301B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Mar 18, 2014·8 cites·20 claims
- 1286US7428060B2Optimization of diffraction order selection for two-dimensional structuresTIMBRE TECH INC·Filed 2006·Granted Sep 23, 2008·17 cites·41 claims
- 1383US8645887B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Feb 4, 2014·6 cites·20 claims
- 1483US8381152B2Method and system for model-based design and layout of an integrated circuitCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Feb 19, 2013·10 cites·33 claims
- 1583US6591405B1Clustering for data compressionTIMBRE TECH INC·Filed 2000·Granted Jul 8, 2003·22 cites·33 claims
- 1682US7505153B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2008·Granted Mar 17, 2009·5 cites·19 claims
- 1782US6853942B2Metrology hardware adaptation with universal libraryTIMBRE TECH INC·Filed 2002·Granted Feb 8, 2005·20 cites·62 claims
- 1879US7216045B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2002·Granted May 8, 2007·22 cites·2 claims
- 1978US8302052B2Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit designLEE BRIAN·Filed 2009·Granted Oct 30, 2012·10 cites·34 claims
- 2075US7523076B2Selecting a profile model for use in optical metrology using a machine learning systemTOKYO ELECTRON LTD·Filed 2004·Granted Apr 21, 2009·13 cites·47 claims
- 2175US6842261B2Integrated circuit profile value determinationTIMBRE TECH INC·Filed 2002·Granted Jan 11, 2005·14 cites·45 claims
- 2273US6857114B2Clustering for data compressionTIMBRE TECH INC·Filed 2003·Granted Feb 15, 2005·4 cites·24 claims
- 2363US7394554B2Selecting a hypothetical profile to use in optical metrologyTIMBRE TECH INC·Filed 2003·Granted Jul 1, 2008·10 cites·32 claims
- 2462US11526347B2Intelligent software patch managementVMWARE INC·Filed 2021·Granted Dec 13, 2022·0 cites·20 claims
- 2544US7474993B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2007·Granted Jan 6, 2009·0 cites·20 claims
- 2639US2004267397A1Optical metrology of structures formed on semiconductor wafer using machine learning systemsFiled 2003·Application pending·0 cites
- 2737US2004090629A1Diffraction order selection for optical metrology simulationFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →