Inventor · disambiguated record
Tomonori Saeki
Also filed as: SAEKI TOMONORI
14 granted patents·6 pending applications·174 citations·filing 2000–2021
92Inventor score
Files withHITACHI HIGH TECH CORP5HITACHI LTD3NAKAHARA MIWAKO2RENESAS ELECTRONICS CORP2RENESAS TECH CORP2
Top patents by PatentIndex Score
20 records- 0190US6607988B2Manufacturing method of semiconductor integrated circuit deviceHITACHI LTD·Filed 2000·Granted Aug 19, 2003·53 cites·10 claims
- 0290US6586161B2Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceHITACHI LTD·Filed 2002·Granted Jul 1, 2003·39 cites·46 claims
- 0389US6737221B2Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceRENESAS TECH CORP·Filed 2003·Granted May 18, 2004·33 cites·3 claims
- 0482US8293648B2Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceFUTASE TAKUYA·Filed 2011·Granted Oct 23, 2012·4 cites·5 claims
- 0580US7247864B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Jul 24, 2007·6 cites·5 claims
- 0679US8580039B2Surface treatment method of metal member and cleaning nozzleSAEKI TOMONORI·Filed 2010·Granted Nov 12, 2013·4 cites·8 claims
- 0779US7205541B1Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 17, 2007·4 cites·8 claims
- 0876US7601974B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Oct 13, 2009·3 cites·13 claims
- 0976US6539959B1Cleaning apparatus for plate-like part and method thereofHITACHI LTD·Filed 2000·Granted Apr 1, 2003·22 cites·11 claims
- 1072US7964509B2Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceRENESAS ELECTRONICS CORP·Filed 2008·Granted Jun 21, 2011·2 cites·10 claims
- 1171US8034717B2Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceRENESAS ELECTRONICS CORP·Filed 2008·Granted Oct 11, 2011·2 cites·9 claims
- 1265US8071961B2Charged particle beam apparatusMITO HIROAKI·Filed 2007·Granted Dec 6, 2011·2 cites·4 claims
- 1357US2008190928A1Apparatus having vacuum vesselYAHAGI YASUO·Filed 2007·Application pending·0 cites
- 1454US2023173452A1Adsorption member and method of manufacturing sameHITACHI METALS LTD·Filed 2021·Application pending·0 cites
- 1554US2013239663A1Apparatus for evaluating lubricanHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1652US11733264B2Cantilever, scanning probe microscope, and measurement method using scanning probe microscopeHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 22, 2023·0 cites·19 claims
- 1749US12228911B2Control apparatus of machining device and control method of the sameMAZDA MOTOR·Filed 2020·Granted Feb 18, 2025·0 cites·9 claims
- 1843US2004259300A1Mass production method of semiconductor integrated circuit device and manufacturing method of electronic deviceRENESAS TECH CORP·Filed 2004·Application pending·0 cites
- 1936US2007004027A1Method for manufacturing a biosensor elementNAKAHARA MIWAKO·Filed 2005·Application pending·0 cites
- 2029US2007003945A1Method for manufacturing a biosensor element and for testing the sameNAKAHARA MIWAKO·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →