Inventor · disambiguated record
Frederick H. Schamber
Also filed as: SCHAMBER FREDERICK · SCHAMBER FREDERICK H
9 granted patents·138 citations·filing 1979–2016
88Inventor score
Top patents by PatentIndex Score
9 records- 0188US6683316B2Apparatus for correlating an optical image and a SEM image and method of use thereofASPEX LLC·Filed 2002·Granted Jan 27, 2004·58 cites·18 claims
- 0287US4288692ABeam current normalization in an X-ray microanalysis instrumentTRACOR NORTHERN INC·Filed 1979·Granted Sep 8, 1981·28 cites·15 claims
- 0386US8334511B2Electron microscope with integrated detector(s)SCHAMBER FREDERICK H·Filed 2010·Granted Dec 18, 2012·10 cites·26 claims
- 0478USRE44035EApparatus for correlating an optical image and a SEM image and method of use thereofSCHAMBER FREDERICK H·Filed 2009·Granted Mar 5, 2013·6 cites·30 claims
- 0567US9972474B2Electron microscope with multiple types of integrated x-ray detectors arranged in an arrayFEI CO·Filed 2016·Granted May 15, 2018·1 cites·19 claims
- 0664US8987665B2Electron microscope with integrated detector(s)FEI CO·Filed 2012·Granted Mar 24, 2015·1 cites·24 claims
- 0761US5376799ATurbo-pumped scanning electron microscopeRJ LEE GROUP INC·Filed 1993·Granted Dec 27, 1994·19 cites·19 claims
- 0854US5376792AScanning electron microscopeRJ LEE GROUP INC·Filed 1993·Granted Dec 27, 1994·15 cites·24 claims
- 0939US7476858B2Particle detection auditing system and methodASPEX CORP·Filed 2006·Granted Jan 13, 2009·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →