Inventor · disambiguated record
Wei-Long Wang
Also filed as: Wang wei-long
9 granted patents·84 citations·filing 2010–2016
86Inventor score
Top patents by PatentIndex Score
9 records- 0195US8943445B2Method of merging color sets of layoutTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 27, 2015·29 cites·20 claims
- 0291US8381153B2Dissection splitting with optical proximity correction and mask rule check enforcementTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 19, 2013·21 cites·20 claims
- 0390US8631379B2Decomposing integrated circuit layoutCHEN PI-TSUNG·Filed 2010·Granted Jan 14, 2014·21 cites·14 claims
- 0481US9208275B2Methods for fabricating integrated circuits including generating photomasks for directed self-assemblyGLOBALFOUNDRIES INC·Filed 2014·Granted Dec 8, 2015·5 cites·20 claims
- 0580US8378319B2System and method for generating direct-write patternTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 19, 2013·4 cites·20 claims
- 0664US9305800B2Methods for fabricating integrated circuits using directed self-assembly including lithographically-printable assist featuresGLOBALFOUNDRIES INC·Filed 2014·Granted Apr 5, 2016·1 cites·20 claims
- 0763US9286434B2Methods for fabricating integrated circuits including generating photomasks for directed self-assembly (DSA) using DSA target patternsGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 15, 2016·1 cites·19 claims
- 0861US9122160B2Method and apparatus for performing optical proximity and photomask correctionCHUA GEK SOON·Filed 2013·Granted Sep 1, 2015·2 cites·11 claims
- 0944US10055535B2Method, system and program product for identifying anomalies in integrated circuit design layoutsGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 21, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →