Inventor · disambiguated record
Herve Deslandes
Also filed as: DESLANDES HERVE
10 granted patents·2 pending applications·41 citations·filing 2011–2018
84Inventor score
Top patents by PatentIndex Score
12 records- 0188US8742347B2Three-dimensional hot spot localizationALTMANN FRANK·Filed 2011·Granted Jun 3, 2014·20 cites·16 claims
- 0286US9025020B2Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDESLANDES HERVE·Filed 2011·Granted May 5, 2015·14 cites·18 claims
- 0378US9098892B2Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2014·Granted Aug 4, 2015·3 cites·18 claims
- 0477US9322715B2Three-dimensional hot spot localizationDCG SYSTEMS INC·Filed 2014·Granted Apr 26, 2016·3 cites·20 claims
- 0564US10620263B2System and method for fault isolation by emission spectra analysisFEI EFA INC·Filed 2018·Granted Apr 14, 2020·0 cites·20 claims
- 0660US9817060B2Optimized wavelength photon emission microscope for VLSI devicesFEI EFA INC·Filed 2014·Granted Nov 14, 2017·1 cites·15 claims
- 0757US2014191111A1Accumulating optical detector with shutter emulationDCG SYSTEMS INC·Filed 2013·Application pending·0 cites
- 0856US10041997B2System and method for fault isolation by emission spectra analysisFEI EFA INC·Filed 2015·Granted Aug 7, 2018·0 cites·21 claims
- 0949US10514418B2Optimized wavelength photon emission microscope for VLSI devicesFEI CO·Filed 2016·Granted Dec 24, 2019·0 cites·23 claims
- 1047US2015338458A1Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2015·Application pending·0 cites
- 1142US9903824B2Spectral mapping of photo emissionFEI EFA INC·Filed 2015·Granted Feb 27, 2018·0 cites·20 claims
- 1237US10049949B2In-situ packaging decapsulation feature for electrical fault localizationFEI CO·Filed 2016·Granted Aug 14, 2018·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →