Inventor · disambiguated record
Kotoko Hirose
Also filed as: HIROSE KOTOKO
9 granted patents·1 pending application·37 citations·filing 2007–2012
85Inventor score
Top patents by PatentIndex Score
10 records- 0188US7714286B2Charged particle beam apparatus, aberration correction value calculation unit therefor, and aberration correction program thereforHITACHI HIGH TECH CORP·Filed 2008·Granted May 11, 2010·11 cites·13 claims
- 0283US8129680B2Charged particle beam apparatus including aberration correctorHIROSE KOTOKO·Filed 2009·Granted Mar 6, 2012·7 cites·12 claims
- 0383US7834326B2Aberration corrector and charged particle beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 16, 2010·7 cites·16 claims
- 0481US7915582B2Method for estimation of probe shape in charged particle beam instrumentsHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 29, 2011·5 cites·12 claims
- 0572US8581190B2Charged particle beam apparatus and geometrical aberration measurement method thereforNAKANO TOMONORI·Filed 2009·Granted Nov 12, 2013·3 cites·19 claims
- 0667US8772732B2Scanning charged particle beam device and method for correcting chromatic spherical combination aberrationNAKANO TOMONORI·Filed 2010·Granted Jul 8, 2014·2 cites·12 claims
- 0767US8258475B2Charged particle radiation device provided with aberration correctorHIROSE KOTOKO·Filed 2010·Granted Sep 4, 2012·2 cites·20 claims
- 0852US8558171B2Charged particle beam apparatus including aberration correctorHIROSE KOTOKO·Filed 2012·Granted Oct 15, 2013·0 cites·13 claims
- 0951US8436899B2Method and apparatus of tilted illumination observationKAWASAKI TAKESHI·Filed 2009·Granted May 7, 2013·0 cites·10 claims
- 1050US2011210248A1Charged particle beam instrument comprising an aberration correctorHITACHI HIGH TECH CORP·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →