Inventor · disambiguated record
Eric Hong
Also filed as: HONG ERIC · HONG ERIC LIAU CHEE
12 granted patents·3 pending applications·28 citations·filing 2004–2024
87Inventor score
Top patents by PatentIndex Score
15 records- 0191US9903877B2Sensors for assaying coagulation in fluid samplesABBOTT POINT OF CARE INC·Filed 2015·Granted Feb 27, 2018·7 cites·63 claims
- 0290US10352951B2Sensors for assaying coagulation in fluid samplesABBOTT POINT OF CARE INC·Filed 2018·Granted Jul 16, 2019·5 cites·20 claims
- 0390US10247741B2Microfabricated device with micro-environment sensors for assaying coagulation in fluid samplesABBOTT POINT OF CARE INC·Filed 2015·Granted Apr 2, 2019·4 cites·24 claims
- 0485US9685995B2Thin chassis near field communication (NFC) antenna integrationINTEL CORP·Filed 2015·Granted Jun 20, 2017·3 cites·21 claims
- 0581US11156620B2Microfabricated device with micro-environment sensors for assaying coagulation in fluid samplesABBOTT POINT OF CARE INC·Filed 2019·Granted Oct 26, 2021·1 cites·26 claims
- 0672US2022003790A1Microfabricated device with micro-environment sensors for assaying coagulation in fluid samplesABBOTT POINT OF CARE INC·Filed 2021·Application pending·0 cites
- 0768US2025019590A1Nitride etchant composition and methodENTEGRIS INC·Filed 2024·Application pending·0 cites
- 0863US12152187B2Nitride etchant composition and methodENTEGRIS INC·Filed 2021·Granted Nov 26, 2024·0 cites·5 claims
- 0963US2023030323A1Method and composition for etching molybdenumENTEGRIS INC·Filed 2022·Application pending·0 cites
- 1058US11492709B2Method and composition for etching molybdenumENTEGRIS INC·Filed 2021·Granted Nov 8, 2022·0 cites·17 claims
- 1153US12272560B2Selective removal of metal oxide hard masksENTEGRIS INC·Filed 2021·Granted Apr 8, 2025·0 cites·11 claims
- 1248US10577567B2Cleaning compositions for removing post etch residueENTEGRIS INC·Filed 2017·Granted Mar 3, 2020·0 cites·19 claims
- 1348US7246291B2Method for localization and generation of short critical sequenceINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 17, 2007·4 cites·17 claims
- 1447US10790187B2Post-etch residue removal for advanced node beol processingENTEGRIS INC·Filed 2018·Granted Sep 29, 2020·0 cites·14 claims
- 1547US7210086B2Long running test method for a circuit design analysisINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 24, 2007·4 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →