Inventor · disambiguated record
Tom Miller
Also filed as: MILLER TOM · MILLER TOM G
29 granted patents·7 pending applications·1,335 citations·filing 1997–2025
97Inventor score
Top patents by PatentIndex Score
36 records- 0197US10231653B2Advanced continuous analyte monitoring systemBOHM SEBASTIAN·Filed 2011·Granted Mar 19, 2019·833 cites·12 claims
- 0296US6202029B1Non-contact electrical conduction measurement for insulating filmsFiled 2000·Granted Mar 13, 2001·90 cites·10 claims
- 0395US6191605B1Contactless method for measuring total charge of an insulating layer on a substrate using corona chargeFiled 1997·Granted Feb 20, 2001·111 cites·11 claims
- 0495US6097196ANon-contact tunnelling field measurement for a semiconductor oxide layerFiled 1997·Granted Aug 1, 2000·116 cites·4 claims
- 0594US8253118B2Charged particle beam system having multiple user-selectable operating modesZHANG SHOUYIN·Filed 2009·Granted Aug 28, 2012·32 cites·22 claims
- 0694US6060709AApparatus and method for depositing uniform charge on a thin oxide semiconductor waferFiled 1997·Granted May 9, 2000·64 cites·14 claims
- 0793US10687740B2Advanced continuous analyte monitoring systemDEXCOM INC·Filed 2019·Granted Jun 23, 2020·13 cites·13 claims
- 0891US10362973B2Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a userDEXCOM INC·Filed 2015·Granted Jul 30, 2019·10 cites·6 claims
- 0991US2025366714A1Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a userDEXCOM INC·Filed 2025·Application pending·0 cites
- 1088US8445870B2Charged particle beam system having multiple user-selectable operating modesZHANG SHOUYIN·Filed 2011·Granted May 21, 2013·14 cites·14 claims
- 1187US10312162B2Methods and apparatus for semiconductor sample workflowFEI CO·Filed 2017·Granted Jun 4, 2019·4 cites·14 claims
- 1286US7714300B1High-speed high-efficiency solid-state electron detectorKLA TENCOR TECH CORP·Filed 2007·Granted May 11, 2010·8 cites·11 claims
- 1385US11690538B2Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a userDEXCOM INC·Filed 2019·Granted Jul 4, 2023·3 cites·11 claims
- 1484US12303262B2Advanced continuous analyte monitoring systemDEXCOM INC·Filed 2023·Granted May 20, 2025·0 cites·20 claims
- 1583US12396663B2Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a userDEXCOM INC·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 1683US11179069B2Advanced continuous analyte monitoring systemDEXCOM INC·Filed 2019·Granted Nov 23, 2021·2 cites·9 claims
- 1783US2024032826A1Advanced continuous analyte monitoring systemDEXCOM INC·Filed 2023·Application pending·0 cites
- 1881US8124942B2Plasma igniter for an inductively coupled plasma ion sourceGRAUPERA ANTHONY·Filed 2010·Granted Feb 28, 2012·9 cites·21 claims
- 1980US8183547B2Dual beam systemMILLER TOM·Filed 2010·Granted May 22, 2012·5 cites·20 claims
- 2079US12471849B2Systems, devices and methods for analyte monitoring systemDEXCOM INC·Filed 2023·Granted Nov 18, 2025·0 cites·17 claims
- 2178US8314409B2Pattern modification schemes for improved FIB patterningMILLER TOM·Filed 2010·Granted Nov 20, 2012·6 cites·15 claims
- 2275US12310723B2Advanced continuous analyte monitoring systemDEXCOM INC·Filed 2021·Granted May 27, 2025·0 cites·11 claims
- 2370US8723143B2Plasma igniter for an inductively coupled plasma ion sourceGRAUPERA ANTHONY·Filed 2011·Granted May 13, 2014·2 cites·18 claims
- 2469US10052050B2Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a userDEXCOM INC·Filed 2014·Granted Aug 21, 2018·2 cites·15 claims
- 2562US9123500B2Automated ion beam idleMILLER TOM·Filed 2012·Granted Sep 1, 2015·2 cites·18 claims
- 2662US2020275894A1Systems, devices and methods for analyte monitoring systemDEXCOM INC·Filed 2020·Application pending·0 cites
- 2759US6335630B2Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona chargeFiled 2000·Granted Jan 1, 2002·6 cites·7 claims
- 2857US11278244B2Systems, devices and methods for analyte monitoring systemDEXCOM INC·Filed 2017·Granted Mar 22, 2022·0 cites·8 claims
- 2955US9105438B2Imaging and processing for plasma ion sourceFEI CO·Filed 2013·Granted Aug 11, 2015·0 cites·20 claims
- 3052US9257261B2Method for rapid switching between a high current mode and a low current mode in a charged particle beam systemMILLER TOM·Filed 2012·Granted Feb 9, 2016·0 cites·20 claims
- 3151US8624206B2Pattern modification schemes for improved FIB patterningFEI CO·Filed 2012·Granted Jan 7, 2014·0 cites·14 claims
- 3250US2013098871A1Internal Split Faraday Shield for an Inductively Coupled Plasma SourceMILLER TOM·Filed 2011·Application pending·0 cites
- 3349US6448804B2Contactless total charge measurement with coronaFiled 2001·Granted Sep 10, 2002·3 cites·2 claims
- 3449US2013151273A1Mobile samplingJONES JEFF·Filed 2012·Application pending·0 cites
- 3548US2010032296A1Systems and methods for quantitative analyte transferPROTEIN FOREST INC·Filed 2008·Application pending·0 cites
- 3647US2012232925A1Offering drug samples through electronic medical recordsQUINN TOM·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →