Inventor · disambiguated record
Gregory S. Horner
Also filed as: HORNER GREGORY S
24 granted patents·921 citations·filing 1995–2014
97Inventor score
Top patents by PatentIndex Score
24 records- 0196US6202029B1Non-contact electrical conduction measurement for insulating filmsFiled 2000·Granted Mar 13, 2001·90 cites·10 claims
- 0295US6191605B1Contactless method for measuring total charge of an insulating layer on a substrate using corona chargeFiled 1997·Granted Feb 20, 2001·111 cites·11 claims
- 0395US6097196ANon-contact tunnelling field measurement for a semiconductor oxide layerFiled 1997·Granted Aug 1, 2000·116 cites·4 claims
- 0494US6060709AApparatus and method for depositing uniform charge on a thin oxide semiconductor waferFiled 1997·Granted May 9, 2000·64 cites·14 claims
- 0593US7012438B1Methods and systems for determining a property of an insulating filmKLA TENCOR TECH CORP·Filed 2003·Granted Mar 14, 2006·63 cites·30 claims
- 0693US6734696B2Non-contact hysteresis measurements of insulating filmsKLA TENCOR TECH CORP·Filed 2002·Granted May 11, 2004·57 cites·21 claims
- 0792US5594247AApparatus and method for depositing charge on a semiconductor waferKEITHLEY INSTRUMENTS·Filed 1995·Granted Jan 14, 1997·120 cites·17 claims
- 0890US7358748B1Methods and systems for determining a property of an insulating filmKLA TENCOR TECH CORP·Filed 2005·Granted Apr 15, 2008·14 cites·20 claims
- 0988US6121783AMethod and apparatus for establishing electrical contact between a wafer and a chuckFiled 1997·Granted Sep 19, 2000·103 cites·14 claims
- 1087US7719294B1Systems configured to perform a non-contact method for determining a property of a specimenKLA TENCOR TECH CORP·Filed 2006·Granted May 18, 2010·10 cites·23 claims
- 1187US7248062B1Contactless charge measurement of product wafers and control of corona generation and depositionKLA TENCOR TECH CORP·Filed 2003·Granted Jul 24, 2007·30 cites·19 claims
- 1286US8299416B2High speed quantum efficiency measurement apparatus utilizing solid state lightsourceARBORE MARK A·Filed 2010·Granted Oct 30, 2012·11 cites·18 claims
- 1386US7230443B1Non-contact mobile charge measurement with leakage band-bending and dipole correctionKLA TENCOR CORP·Filed 2005·Granted Jun 12, 2007·14 cites·22 claims
- 1480US7075318B1Methods for imperfect insulating film electrical thickness/capacitance measurementKLA TENCOR TECH CORP·Filed 2004·Granted Jul 11, 2006·20 cites·17 claims
- 1580US6771092B1Non-contact mobile charge measurement with leakage band-bending and dipole correctionFiled 2002·Granted Aug 3, 2004·21 cites·1 claims
- 1678US8278937B2High speed detection of shunt defects in photovoltaic and optoelectronic devicesVASILYEV LEONID A·Filed 2010·Granted Oct 2, 2012·8 cites·23 claims
- 1778US7064565B1Methods and systems for determining an electrical property of an insulating filmKLA TENCOR TECH CORP·Filed 2003·Granted Jun 20, 2006·21 cites·18 claims
- 1874US7538333B1Contactless charge measurement of product wafers and control of corona generation and depositionKLA TENCOR TECH CORP·Filed 2006·Granted May 26, 2009·3 cites·18 claims
- 1968US6522158B1Non-contact mobile charge measurement with leakage band-bending and dipole correctionKEITHLEY INSTRUMENTS·Filed 1997·Granted Feb 18, 2003·25 cites·1 claims
- 2063US6937050B1Non-contact mobile charge measurement with leakage band-bending and dipole correctionFiled 2004·Granted Aug 30, 2005·10 cites·1 claims
- 2159US6335630B2Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona chargeFiled 2000·Granted Jan 1, 2002·6 cites·7 claims
- 2251US7397254B1Methods for imperfect insulating film electrical thickness/capacitance measurementKLA TENCOR TECH CORP·Filed 2006·Granted Jul 8, 2008·1 cites·19 claims
- 2349US6448804B2Contactless total charge measurement with coronaFiled 2001·Granted Sep 10, 2002·3 cites·2 claims
- 2445US9537444B2Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing processTAU SCIENCE CORP·Filed 2014·Granted Jan 3, 2017·0 cites·42 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →