Inventor · disambiguated record
Yoshikazu Arisaka
Also filed as: ARISAKA YOSHIKAZU
8 granted patents·4 pending applications·91 citations·filing 2002–2008
86Inventor score
Top patents by PatentIndex Score
12 records- 0193US7129726B2Testing device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2005·Granted Oct 31, 2006·26 cites·15 claims
- 0291US7471096B2Contactor for electronic parts and a contact methodFUJITSU LTD·Filed 2006·Granted Dec 30, 2008·28 cites·10 claims
- 0359US7171592B2Self-testing circuit in semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Jan 30, 2007·13 cites·19 claims
- 0457US7355421B2Semiconductor apparatus testing arrangement and semiconductor apparatus testing methodFUJITSU LTD·Filed 2006·Granted Apr 8, 2008·2 cites·3 claims
- 0557US6686644B2Semiconductor device provided with fuse and method of disconnecting fuseFUJITSU LTD·Filed 2002·Granted Feb 3, 2004·10 cites·13 claims
- 0650US7649370B2Evaluation method of probe mark of probe needle of probe card using imaginary electrode pad and designated determination frameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jan 19, 2010·2 cites·11 claims
- 0749US2008227226A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2008·Application pending·0 cites
- 0846US7256591B2Probe card, having cantilever-type probe and methodFUJITSU LTD·Filed 2002·Granted Aug 14, 2007·5 cites·17 claims
- 0946US7180312B2Probe card and method for manufacturing probe cardFUJITSU LTD·Filed 2003·Granted Feb 20, 2007·5 cites·15 claims
- 1044US2006097356A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2005·Application pending·0 cites
- 1136US2007134824A1Probe card and method for manufacturing probe cardFUJITSU LTD·Filed 2007·Application pending·0 cites
- 1229US2003098702A1Probe card and probe contact methodFUJITSU LTD·Filed 2002·Application pending·0 cites
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