Inventor · disambiguated record
Richard C. Dokken
Also filed as: DOKKEN RICHARD C
8 granted patents·98 citations·filing 2003–2008
86Inventor score
Technology areasG01R
Top patents by PatentIndex Score
8 records- 0189US7568139B2Process for identifying the location of a break in a scan chain in real timeINOVYS CORP·Filed 2006·Granted Jul 28, 2009·21 cites·8 claims
- 0286US7853846B2Locating hold time violations in scan chains by generating patterns on ATEVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Dec 14, 2010·21 cites·6 claims
- 0385US7047463B1Method and system for automatically determining a testing order when executing a test flowINOVYS CORP·Filed 2003·Granted May 16, 2006·34 cites·23 claims
- 0470US8010856B2Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chainsVERIGY PTE LTD SINGAPORE·Filed 2008·Granted Aug 30, 2011·7 cites·23 claims
- 0567US8006149B2System and method for device performance characterization in physical and logical domains with AC SCAN testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 23, 2011·5 cites·12 claims
- 0665US8615691B2Process for improving design-limited yield by localizing potential faults from production test dataDOKKEN RICHARD C·Filed 2007·Granted Dec 24, 2013·5 cites·13 claims
- 0754US8453026B2Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signaturesCHAN GERALD S·Filed 2006·Granted May 28, 2013·3 cites·6 claims
- 0852US8060851B2Method for operating a secure semiconductor IP server to support failure analysisDOKKEN RICHARD C·Filed 2007·Granted Nov 15, 2011·2 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →