Assignee
INOVYS CORP
US·10 granted patents·1 pending application·159 citations·filing 2001–2006
Top patents by PatentIndex Score
11 records- 0189US7568139B2Process for identifying the location of a break in a scan chain in real timeINOVYS CORP·Filed 2006·Granted Jul 28, 2009·21 cites·8 claims
- 0286US7154253B1Digitally controlled modular power supply for automated test equipmentINOVYS CORP·Filed 2005·Granted Dec 26, 2006·14 cites·16 claims
- 0385US7047463B1Method and system for automatically determining a testing order when executing a test flowINOVYS CORP·Filed 2003·Granted May 16, 2006·34 cites·23 claims
- 0477US7032145B1System for dynamic re-allocation of test pattern data for parallel and serial test data patternsINOVYS CORP·Filed 2002·Granted Apr 18, 2006·21 cites·38 claims
- 0571US6859157B1Programmable precision current controlling apparatusINOVYS CORP·Filed 2004·Granted Feb 22, 2005·15 cites·20 claims
- 0670US7013417B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Mar 14, 2006·12 cites·25 claims
- 0768US6839648B1Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipmentINOVYS CORP·Filed 2003·Granted Jan 4, 2005·12 cites·1 claims
- 0864US6750797B1Programmable precision current controlling apparatusINOVYS CORP·Filed 2003·Granted Jun 15, 2004·12 cites·38 claims
- 0963US6591213B1Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipmentINOVYS CORP·Filed 2001·Granted Jul 8, 2003·12 cites·29 claims
- 1057US7114114B1Dynamically reconfigurable precision signal delay test system for automatic test equipmentINOVYS CORP·Filed 2004·Granted Sep 26, 2006·6 cites·25 claims
- 1142US2005203716A1Method and system for delay defect location when testing digital semiconductor devicesINOVYS CORP·Filed 2003·Application pending·0 cites
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