Inventor · disambiguated record
Donald V. Organ
Also filed as: ORGAN DONALD · ORGAN DONALD V · ORGAN DONALD VICK
10 granted patents·1 pending application·584 citations·filing 1997–2019
91Inventor score
Top patents by PatentIndex Score
11 records- 0194US6449741B1Single platform electronic testerLTX CORP·Filed 1998·Granted Sep 10, 2002·127 cites·11 claims
- 0293US6591407B1Method and apparatus for interconnect-driven optimization of integrated circuit designSEQUENCE DESIGN INC·Filed 2000·Granted Jul 8, 2003·146 cites·60 claims
- 0386US6332212B1Capturing and displaying computer program execution timingLTX CORP·Filed 1997·Granted Dec 18, 2001·188 cites·38 claims
- 0485US7047463B1Method and system for automatically determining a testing order when executing a test flowINOVYS CORP·Filed 2003·Granted May 16, 2006·34 cites·23 claims
- 0584US7191368B1Single platform electronic testerLTX CORP·Filed 2001·Granted Mar 13, 2007·28 cites·10 claims
- 0680US7222311B2Method and apparatus for interconnect-driven optimization of integrated circuit designSEQUENCE DESIGN INC·Filed 2003·Granted May 22, 2007·33 cites·16 claims
- 0772US10948540B2Integrated protocol analyzer configured within automated test equipment (ate) hardwareADVANTEST CORP·Filed 2019·Granted Mar 16, 2021·2 cites·21 claims
- 0865US6512989B1Generating and controlling analog and digital signals on a mixed signal test systemLTX CORP·Filed 1999·Granted Jan 28, 2003·26 cites·37 claims
- 0962US11302412B2Systems and methods for simulated device testing using a memory-based communication protocolADVANTEST CORP·Filed 2019·Granted Apr 12, 2022·0 cites·25 claims
- 1042US10642225B2Reflecting sundialORGAN DONALD VICK·Filed 2017·Granted May 5, 2020·0 cites·16 claims
- 1142US2005203716A1Method and system for delay defect location when testing digital semiconductor devicesINOVYS CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →