Inventor · disambiguated record
Yuichi Hamamura
Also filed as: HAMAMURA YUICHI
20 granted patents·3 pending applications·463 citations·filing 1997–2015
95Inventor score
Top patents by PatentIndex Score
23 records- 0196US6771077B2Method of testing electronic devices indicating short-circuitHITACHI LTD·Filed 2002·Granted Aug 3, 2004·85 cites·11 claims
- 0293US6303932B1Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beamHITACHI LTD·Filed 1998·Granted Oct 16, 2001·84 cites·19 claims
- 0392US6960765B2Probe driving method, and probe apparatusHITACHI ULSI SYS CO LTD·Filed 2001·Granted Nov 1, 2005·50 cites·7 claims
- 0490US5976328APattern forming method using charged particle beam process and charged particle beam processing systemHITACHI LTD·Filed 1997·Granted Nov 2, 1999·58 cites·7 claims
- 0585US5952658AMethod and system for judging milling end point for use in charged particle beam milling systemHITACHI LTD·Filed 1997·Granted Sep 14, 1999·47 cites·35 claims
- 0684US7062081B2Method and system for analyzing circuit pattern defectsHITACHI LTD·Filed 2001·Granted Jun 13, 2006·31 cites·11 claims
- 0784US6476387B1Method and apparatus for observing or processing and analyzing using a charged beamHITACHI LTD·Filed 1999·Granted Nov 5, 2002·44 cites·22 claims
- 0879US7301146B2Probe driving method, and probe apparatusHITACHI LTD·Filed 2005·Granted Nov 27, 2007·8 cites·16 claims
- 0977US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 1075US7945410B2Semiconductor device yield prediction system and methodHITACHI LTD·Filed 2007·Granted May 17, 2011·8 cites·5 claims
- 1172US6895346B2Method for test conditionsHITACHI LTD·Filed 2002·Granted May 17, 2005·10 cites·15 claims
- 1270US7352890B2Method for analyzing circuit pattern defects and a system thereofHITACHI LTD·Filed 2006·Granted Apr 1, 2008·3 cites·7 claims
- 1368US10614391B2Method and apparatus for work quality controlHITACHI LTD·Filed 2015·Granted Apr 7, 2020·3 cites·8 claims
- 1468US6780660B2System for testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 24, 2004·9 cites·10 claims
- 1567US6770496B2Method of testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 3, 2004·8 cites·12 claims
- 1652US6344115B1Pattern forming method using charged particle beam process and charged particle beam processing systemHITACHI LTD·Filed 1999·Granted Feb 5, 2002·8 cites·4 claims
- 1740US8621400B2Method of evaluating systematic defect, and apparatus thereforTAKAGI YUJI·Filed 2011·Granted Dec 31, 2013·0 cites·12 claims
- 1840US2008241486A1Liquid Crystal Display Device with Evaluation Patterns Disposed Thereon, and Method for Manufacturing the SameISHIKAWA SEIJI·Filed 2008·Application pending·0 cites
- 1938US6841405B2Photomask for test wafersHITACHI LTD·Filed 2002·Granted Jan 11, 2005·0 cites·16 claims
- 2037US8675949B2Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review toolTAKAGI YUJI·Filed 2010·Granted Mar 18, 2014·0 cites·18 claims
- 2136US8612811B2Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor deviceMATSUMOTO CHIZU·Filed 2009·Granted Dec 17, 2013·0 cites·17 claims
- 2236US2014177940A1Recipe generation apparatus, inspection support apparatus, inspection system, and recording mediaNAKAGAKI RYO·Filed 2011·Application pending·0 cites
- 2332US2013283227A1Pattern review tool, recipe making tool, and method of making recipeSAKAI TSUNEHIRO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →