Inventor · disambiguated record
Josef S. Watts
Also filed as: WATTS JOSEF S · Watts Josef
34 granted patents·1 pending application·476 citations·filing 1991–2018
97Inventor score
Top patents by PatentIndex Score
35 records- 0198US9960077B1Ultra-scale gate cut pillar with overlay immunity and method for producing the sameGLOBALFOUNDRIES INC·Filed 2017·Granted May 1, 2018·24 cites·20 claims
- 0297US10170473B1Forming long channel FinFET with short channel vertical FinFET and related integrated circuitGLOBALFOUNDRIES INC·Filed 2017·Granted Jan 1, 2019·20 cites·9 claims
- 0396US10177037B2Methods of forming a CT pillar between gate structures in a semiconductorGLOBALFOUNDRIES INC·Filed 2017·Granted Jan 8, 2019·15 cites·15 claims
- 0495US5334880ALow voltage programmable storage elementIBM·Filed 1991·Granted Aug 2, 1994·124 cites·19 claims
- 0591US10079308B1Vertical transistor structure with looped channelGLOBALFOUNDRIES INC·Filed 2017·Granted Sep 18, 2018·8 cites·20 claims
- 0688US10128187B2Integrated circuit structure having gate contact and method of forming sameGLOBALFOUNDRIES INC·Filed 2016·Granted Nov 13, 2018·5 cites·17 claims
- 0787US5420456AZAG fuse for reduced blow-current applicationIBM·Filed 1994·Granted May 30, 1995·98 cites·20 claims
- 0887US5418738ALow voltage programmable storage elementIBM·Filed 1994·Granted May 23, 1995·53 cites·1 claims
- 0985US9405186B1Sample plan creation for optical proximity correction with minimal number of clipsGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 2, 2016·4 cites·20 claims
- 1083US10026740B1DRAM structure with a single diffusion breakGLOBALFOUNDRIES INC·Filed 2017·Granted Jul 17, 2018·3 cites·19 claims
- 1182US10147648B1Vertical fin gate structure for RF deviceGLOBALFOUNDRIES INC·Filed 2017·Granted Dec 4, 2018·3 cites·17 claims
- 1280US7353473B2Modeling small mosfets using ensemble devicesIBM·Filed 2006·Granted Apr 1, 2008·12 cites·4 claims
- 1371US10593754B2SOI device structures with doped regions providing charge sinkingGLOBALFOUNDRIES INC·Filed 2018·Granted Mar 17, 2020·1 cites·19 claims
- 1471US9923046B1Semiconductor device resistor structureGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 20, 2018·1 cites·12 claims
- 1571US7640143B2Circuit statistical modeling for partially correlated model parametersIBM·Filed 2004·Granted Dec 29, 2009·19 cites·9 claims
- 1666US9647145B1Method, apparatus, and system for increasing junction electric field of high current diodeGLOBALFOUNDRIES INC·Filed 2016·Granted May 9, 2017·1 cites·20 claims
- 1765US10090209B2Methods of predicting unity gain frequency with direct current and/or low frequency parametersGLOBALFOUNDRIES INC·Filed 2017·Granted Oct 2, 2018·1 cites·7 claims
- 1865US8453101B1Method, system and program storage device for generating accurate performance targets for active semiconductor devices during new technology node developmentJOHNSON JAMES M·Filed 2011·Granted May 28, 2013·2 cites·25 claims
- 1963US8010930B2Extracting consistent compact model parameters for related devicesIBM·Filed 2008·Granted Aug 30, 2011·2 cites·13 claims
- 2061US8903697B2Solutions for modeling spatially correlated variations in an integrated circuitTROMBLEY HENRY W·Filed 2011·Granted Dec 2, 2014·2 cites·15 claims
- 2160US6314390B1Method of determining model parameters for a MOSFET compact model using a stochastic search algorithmIBM·Filed 1998·Granted Nov 6, 2001·47 cites·21 claims
- 2259US10629532B2Integrated circuit structure having gate contact and method of forming sameGLOBALFOUNDRIES INC·Filed 2018·Granted Apr 21, 2020·0 cites·20 claims
- 2359US8524513B2Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET)IBM·Filed 2013·Granted Sep 3, 2013·1 cites·5 claims
- 2458US8417503B2System and method for target-based compact modelingBERNSTEIN KERRY·Filed 2001·Granted Apr 9, 2013·6 cites·38 claims
- 2558US7783466B2IC chip parameter modelingIBM·Filed 2007·Granted Aug 24, 2010·2 cites·6 claims
- 2654US10374029B2Semiconductor device resistor structureGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 6, 2019·0 cites·16 claims
- 2750US6329690B1Method and apparatus to match semiconductor device performanceIBM·Filed 1999·Granted Dec 11, 2001·16 cites·19 claims
- 2847US10217864B2Double gate vertical FinFET semiconductor structureGLOBALFOUNDRIES INC·Filed 2017·Granted Feb 26, 2019·0 cites·11 claims
- 2947US9704763B2Methods of predicting unity gain frequency with direct current and/or low frequency parametersGLOBALFOUNDRIES INC·Filed 2014·Granted Jul 11, 2017·0 cites·5 claims
- 3044US9570538B2Methods of manufacturing polyresistors with selected TCRIBM·Filed 2014·Granted Feb 14, 2017·0 cites·19 claims
- 3142US8539426B2Method and system for extracting compact models for circuit simulationHYDE PAUL A·Filed 2011·Granted Sep 17, 2013·0 cites·23 claims
- 3242US6683345B1Semiconductor device and method for making the device having an electrically modulated conduction channelIBM·Filed 1999·Granted Jan 27, 2004·6 cites·19 claims
- 3340US9472609B2Methods of manufacturing polyresistors with selected TCRIBM·Filed 2015·Granted Oct 18, 2016·0 cites·5 claims
- 3439US2019108873A1Integrated circuits including a static random access memory cell having enhanced read/write performance, methods of forming the integrated circuits, and methods of operating the integrated circuitsGLOBALFOUNDRIES INC·Filed 2017·Application pending·0 cites
- 3536US8445961B2Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET)KHANDELWAL SOURABH·Filed 2010·Granted May 21, 2013·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →