Inventor · disambiguated record
Pleun Dona
Also filed as: DONA PLEUN
24 granted patents·7 pending applications·160 citations·filing 2007–2023
95Inventor score
Files withFEI CO26VON HARRACH HANNO SEBASTIAN2DONA PLEUN1VAN DEN BOOM STEPHANUS HUBERTUS LEONARDUS1VAN VEEN GERARD ANNE NICOLAAS1
Top patents by PatentIndex Score
31 records- 0196US7767979B2Method for coupling and disconnecting a co-operative composite structure of a sample carrier and a sample holderFEI CO·Filed 2007·Granted Aug 3, 2010·26 cites·7 claims
- 0294USD657474SSample carrierDONA PLEUN·Filed 2010·Granted Apr 10, 2012·31 cites·1 claims
- 0394US8080791B2X-ray detector for electron microscopeVON HARRACH HANNO SEBASTIAN·Filed 2009·Granted Dec 20, 2011·28 cites·33 claims
- 0492US8011259B2Sample carrier comprising a deformable strip of material folded back upon itself and sample holderFEI CO·Filed 2010·Granted Sep 6, 2011·11 cites·18 claims
- 0591US11101101B2Laser-based phase plate image contrast manipulationFEI CO·Filed 2020·Granted Aug 24, 2021·3 cites·25 claims
- 0689US8410439B2X-ray detector for electron microscopeVON HARRACH HANNO SEBASTIAN·Filed 2011·Granted Apr 2, 2013·9 cites·21 claims
- 0788US11328892B2Coating on dielectric insert of a resonant RF cavityFEI CO·Filed 2020·Granted May 10, 2022·4 cites·13 claims
- 0885US10921268B1Methods and devices for preparing sample for cryogenic electron microscopyFEI CO·Filed 2019·Granted Feb 16, 2021·4 cites·18 claims
- 0985US7888655B2Transfer mechanism for transferring a specimenFEI CO·Filed 2007·Granted Feb 15, 2011·13 cites·20 claims
- 1084US8592764B2X-ray detector for electron microscopeFEI CO·Filed 2013·Granted Nov 26, 2013·4 cites·22 claims
- 1182US11417498B2Method of manufacturing a charged particle detectorFEI CO·Filed 2020·Granted Aug 16, 2022·1 cites·20 claims
- 1281US9741529B2Micro-chamber for inspecting sample materialFEI CO·Filed 2016·Granted Aug 22, 2017·3 cites·20 claims
- 1378US11101104B2Multi modal cryo compatible GUID gridFEI CO·Filed 2019·Granted Aug 24, 2021·3 cites·20 claims
- 1478US10410827B2Gun lens design in a charged particle microscopeFEI CO·Filed 2017·Granted Sep 10, 2019·2 cites·15 claims
- 1578US7989778B2Charged-particle optical system with dual loading optionsFEI CO·Filed 2009·Granted Aug 2, 2011·10 cites·6 claims
- 1677US11915904B2Reduction of thermal magnetic field noise in TEM corrector systemsFEI CO·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 1775US2023207254A1Electron microscope with improved imaging resolutionFEI CO·Filed 2023·Application pending·0 cites
- 1872US11437216B2Reduction of thermal magnetic field noise in TEM corrector systemsFEI CO·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 1971US8993963B2Mounting structures for multi-detector electron microscopesFEI CO·Filed 2014·Granted Mar 31, 2015·1 cites·21 claims
- 2067US9162211B2Micro-reactor for observing particles in a fluidVAN VEEN GERARD ANNE NICOLAAS·Filed 2010·Granted Oct 20, 2015·3 cites·24 claims
- 2165US9812285B2Holder assembly for cooperating with a nanoreactor and an electron microscopeFEI CO·Filed 2016·Granted Nov 7, 2017·1 cites·19 claims
- 2264US9524850B2Holder assembly for cooperating with an environmental cell and an electron microscopeFEI CO·Filed 2013·Granted Dec 20, 2016·1 cites·20 claims
- 2361US11972920B2Vacuum compatible X-ray shieldFEI CO·Filed 2021·Granted Apr 30, 2024·0 cites·25 claims
- 2460US8757873B2Method of measuring the temperature of a sample carrier in a charged particle-optical apparatusVAN DEN BOOM STEPHANUS HUBERTUS LEONARDUS·Filed 2011·Granted Jun 24, 2014·2 cites·17 claims
- 2560US2020013580A1Electron microscope with improved imaging resolutionFEI CO·Filed 2019·Application pending·0 cites
- 2658US2014077080A1X-ray Detector for Electron MicroscopeFEI CO·Filed 2013·Application pending·0 cites
- 2758US2024203685A1Pole piece incorporating optical cavity for improved phase-contrast in electron microscope imagingFEI CO·Filed 2022·Application pending·0 cites
- 2855US11773905B2Axial alignment assembly, and charged particle microscope comprising such an alignment assemblyFEI CO·Filed 2021·Granted Oct 3, 2023·0 cites·18 claims
- 2954US2024112878A1Charged particle microscope having vacuum in specimen chamberFEI CO·Filed 2022·Application pending·0 cites
- 3053US2024161999A1Laser Thermal Epitaxy in a Charged Particle MicroscopeFEI CO·Filed 2022·Application pending·0 cites
- 3135US2016244871A1Multi-source gis for particle-optical apparatusFEI CO·Filed 2016·Application pending·0 cites
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