Inventor · disambiguated record
Sebastien Egret
Also filed as: EGRET SEBASTIEN
3 granted patents·29 citations·filing 2006–2012
71Inventor score
Technology areasG01N
Top patents by PatentIndex Score
3 records- 0189US7467064B2Transforming metrology data from a semiconductor treatment system using multivariate analysisTIMBRE TECH INC·Filed 2006·Granted Dec 16, 2008·16 cites·22 claims
- 0283US8346506B2Transforming metrology data from a semiconductor treatment system using multivariate analysisTOKYO ELECTRON LTD·Filed 2012·Granted Jan 1, 2013·4 cites·4 claims
- 0380US8170833B2Transforming metrology data from a semiconductor treatment system using multivariate analysisVUONG VI·Filed 2008·Granted May 1, 2012·9 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →