Assignee
KES SYSTEMS INC
US·4 granted patents·2 pending applications·76 citations·filing 2004–2021
Top patents by PatentIndex Score
6 records- 0191US11719743B2Method and apparatus for conducting burn-in testing of semiconductor devicesKES SYSTEMS INC·Filed 2021·Granted Aug 8, 2023·3 cites·9 claims
- 0288US7151388B2Method for testing semiconductor devices and an apparatus thereforKES SYSTEMS INC·Filed 2004·Granted Dec 19, 2006·69 cites·20 claims
- 0385US11061069B2Burn-in test apparatus for semiconductor devicesKES SYSTEMS INC·Filed 2017·Granted Jul 13, 2021·4 cites·35 claims
- 0450US11768224B2Test and burn-in apparatus that provides variable thermal resistanceKES SYSTEMS INC·Filed 2020·Granted Sep 26, 2023·0 cites·22 claims
- 0546US2007040570A1Method for testing semiconductor devices and an apparatus thereforKES SYSTEMS INC·Filed 2006·Application pending·0 cites
- 0646US2007040569A1Method for testing semiconductor devices and an apparatus thereforKES SYSTEMS INC·Filed 2006·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →